Self-focusing of a spatially modulated beam within the paraxial complex geometrical optics framework in low-density plasmas

Author(s):  
Alessandro Ruocco ◽  
Guillaume Duchateau ◽  
Vladimir T Tikhonchuk
1987 ◽  
Vol 30 (5) ◽  
pp. 1521 ◽  
Author(s):  
R. Marchand ◽  
R. Rankin ◽  
C. E. Capjack ◽  
A. Birnboim

2004 ◽  
Vol 243 (2) ◽  
pp. 101-112 ◽  
Author(s):  
Clarence P. Cain ◽  
Robert J. Thomas ◽  
Gary D. Noojin ◽  
David J. Stolarski ◽  
Paul K. Kennedy ◽  
...  

2019 ◽  
Vol 61 (11) ◽  
pp. 115009
Author(s):  
A Ruocco ◽  
G Duchateau ◽  
V T Tikhonchuk ◽  
S Hüller

1984 ◽  
Vol 82 (1) ◽  
pp. 111-124 ◽  
Author(s):  
M. Lucchesi ◽  
F. Cornolti ◽  
A. Giulietti ◽  
D. Giulietti ◽  
M. Vaselli

Author(s):  
P.J. Killingworth ◽  
M. Warren

Ultimate resolution in the scanning electron microscope is determined not only by the diameter of the incident electron beam, but by interaction of that beam with the specimen material. Generally, while minimum beam diameter diminishes with increasing voltage, due to the reduced effect of aberration component and magnetic interference, the excited volume within the sample increases with electron energy. Thus, for any given material and imaging signal, there is an optimum volt age to achieve best resolution.In the case of organic materials, which are in general of low density and electric ally non-conducting; and may in addition be susceptible to radiation and heat damage, the selection of correct operating parameters is extremely critical and is achiev ed by interative adjustment.


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