Thermal phase separation of ZrSiO4thin films and frequency- dependent electrical characteristics of the Al/ZrSiO4/p-Si/Al MOS capacitors
2018 ◽
Vol 33
(5)
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pp. 055007
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2019 ◽
Vol 35
(2)
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pp. 025002
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2014 ◽
Vol 583
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pp. 476-480
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2016 ◽
Vol 27
(12)
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pp. 13154-13160
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2015 ◽
Vol 62
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pp. 980-987
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2011 ◽
Vol 21
(5)
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pp. 572-583
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2000 ◽
Vol 29
(8)
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pp. 1027-1032
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2017 ◽
Vol 28
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pp. 7819-7826
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