scholarly journals Optical properties from photoelectron energy-loss spectroscopy of low-temperature aqueous chemically synthesized ZnO nanorods grown on Si

2019 ◽  
Vol 34 (4) ◽  
pp. 045019
Author(s):  
Denis David ◽  
Hatim Alnoor ◽  
Victor Mancir da Silva Santana ◽  
Pascal Bargiela ◽  
Omer Nur ◽  
...  
2008 ◽  
Vol 450 (1-2) ◽  
pp. 521-524 ◽  
Author(s):  
Jinghai Yang ◽  
Jihui Lang ◽  
Lili Yang ◽  
Yongjun Zhang ◽  
Dandan Wang ◽  
...  

2009 ◽  
Vol 44 (1) ◽  
pp. 87-91 ◽  
Author(s):  
J. H. Yang ◽  
J. H. Zheng ◽  
H. J. Zhai ◽  
L. L. Yang

2007 ◽  
Vol 16 (4) ◽  
pp. 286-290
Author(s):  
Y.H. Shin ◽  
Y.H. Park ◽  
Yong-Min Kim

2014 ◽  
Vol 40 (1) ◽  
pp. 2091-2095 ◽  
Author(s):  
Javed Iqbal ◽  
Tariq Jan ◽  
M. Shafiq ◽  
Aqsa Arshad ◽  
Naeem Ahmad ◽  
...  

2008 ◽  
Vol 255 (5) ◽  
pp. 2646-2650 ◽  
Author(s):  
Jinghai Yang ◽  
Ming Gao ◽  
Lili Yang ◽  
Yongjun Zhang ◽  
Jihui Lang ◽  
...  

2006 ◽  
Vol 99 (11) ◽  
pp. 114302 ◽  
Author(s):  
Yuzhen Lv ◽  
Lin Guo ◽  
Huibin Xu ◽  
Lu Ding ◽  
Chunlei Yang ◽  
...  

1992 ◽  
Vol 259 ◽  
Author(s):  
Selmer S. Wong ◽  
Shouleh Nikzad ◽  
Channing C. Ahn ◽  
Aimee L. Smith ◽  
Harry A. Atwater

ABSTRACTWe have employed reflection electron energy loss spectrometry (REELS), a surface chemical analysis technique, in order to analyze contaminant coverages at the submonolayer level during low-temperature in situ cleaning of hydrogen-terminated Si(100). The chemical composition of the surface was analyzed by measurements of the C K, O K and Si L2,3 core loss intensities at various stages of the cleaning. These results were quantified using SiC(100) and SiO2 as reference standards for C and O coverage. Room temperature REELS core loss intensity analysis after sample insertion reveals carbon at fractional monolayer coverage. We have established the REELS detection limit for carbon coverage to be 5±2% of a monolayer. A study of temperature-dependent hydrocarbon desorption from hydrogen-terminated Si(100) reveals the absence of carbon on the surface at temperatures greater than 200°C. This indicates the feasibility of epitaxial growth following an in situ low-temperature cleaning and also indicates the power of REELS as an in situ technique for assessment of surface cleanliness.


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