Improving the data retention of phase change memory by using a doping element in selected Ge2Sb2Te5

2019 ◽  
Vol 40 (4) ◽  
pp. 042402
Author(s):  
Yaoyao Lu ◽  
Daolin Cai ◽  
Yifeng Chen ◽  
Shuai Yan ◽  
Lei Wu ◽  
...  
2013 ◽  
Vol 103 (14) ◽  
pp. 142112 ◽  
Author(s):  
Zhonghua Zhang ◽  
Sannian Song ◽  
Zhitang Song ◽  
Yan Cheng ◽  
Feng Rao ◽  
...  

2013 ◽  
Vol 873 ◽  
pp. 825-830 ◽  
Author(s):  
Xing Long Ji ◽  
Liang Cai Wu ◽  
Feng Rao ◽  
Zhi Tang Song ◽  
Min Zhu ◽  
...  

In this paper, the two time instability factors in phase change memory, amorphous resistance drift and spontaneous crystallization process, are studied based on Ti2.75(SbxTe)97.25 and Ti6.85(SbxTe)93.15. The drift coefficients of both components are calculated and compared under room temperature. The reason why the drift coefficient decreases with the Ti concentration increases is discussed based on the band structure model of amorphous phase change materials. And the data retention change trend is also presented. The experiment results and the physical explaination can also be extended to other metallic element doped SbxTe alloy phase change materials.


2011 ◽  
Vol 109 (6) ◽  
pp. 064503 ◽  
Author(s):  
Yegang Lu ◽  
Sannian Song ◽  
Zhitang Song ◽  
Bo Liu

2016 ◽  
Author(s):  
Yao-Yao Lu ◽  
Dao-Lin Cai ◽  
Yi-Feng Chen ◽  
Yue-Qing Wang ◽  
Hong-Yang Wei ◽  
...  

2016 ◽  
Vol 63 ◽  
pp. 284-290 ◽  
Author(s):  
Yongwoo Kwon ◽  
Byoungnam Park ◽  
Heesun Yang ◽  
Jin-Ha Hwang ◽  
Dae-Hwan Kang ◽  
...  

2010 ◽  
Vol 31 (8) ◽  
pp. 869-871 ◽  
Author(s):  
Wally Czubatyj ◽  
Stephen J Hudgens ◽  
Charles Dennison ◽  
Carl Schell ◽  
Tyler Lowrey

CrystEngComm ◽  
2014 ◽  
Vol 16 (5) ◽  
pp. 757-762 ◽  
Author(s):  
Yimin Chen ◽  
Guoxiang Wang ◽  
Xiang Shen ◽  
Tiefeng Xu ◽  
R. P. Wang ◽  
...  

ZnSb films have higher crystallization temperature (~257 °C), larger crystalline activation energy (~5.63 eV), better 10 year-data-retention (~201 °C) and lower melting temperature (~500 °C).


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