scholarly journals Development of mathematical reference standards for the validation of surface texture parameter calculation software

2018 ◽  
Vol 1065 ◽  
pp. 082004
Author(s):  
Luke Todhunter ◽  
Richard Leach ◽  
Simon Lawes ◽  
François Blateyron ◽  
Peter Harris
2020 ◽  
Vol 8 (1) ◽  
pp. 015010 ◽  
Author(s):  
Luke Todhunter ◽  
Richard Leach ◽  
Simon Lawes ◽  
Peter Harris ◽  
François Blateyron

Author(s):  
Narcisse Talla Tankam ◽  
Albert Dipanda ◽  
Christophe Bobda ◽  
Janvier Fotsing ◽  
Emmanuel Tonyé

2019 ◽  
Vol 7 (1) ◽  
pp. 015020 ◽  
Author(s):  
Luke Todhunter ◽  
Richard Leach ◽  
Simon Lawes ◽  
Peter Harris ◽  
François Blateyron

Author(s):  
E. P. Dryagun ◽  
M. A. Polyakova ◽  
О. A. Belan ◽  
N. T. Alsynbaev
Keyword(s):  

2020 ◽  
pp. 59-63
Author(s):  
A.S. Bondarenko ◽  
A.S. Borovkov ◽  
I.M. Malay ◽  
V.A. Semyonov

The analysis of the current state of the reflection coefficient measurements in waveguides at millimeter waves is carried out. An approach for solving the problem of reproducing the reflection coefficient measurement scale is proposed. Mathematical equations, which are the basis of the reflection coefficient measurement equation are obtained. The method of determining the metrological performance of reflection coefficient unit’s reference standards is developed. The results of electrodynamic modeling and analytical calculations by the developed method are compared. It is shown that this method can be used for reproducing the reflection coefficient unit in the development of the State primary standard.


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