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Site-specific, cross-sectional imaging of biomaterials and the cell/biomaterial interface using focused ion beam/scanning electron microscopy
Journal of Physics Conference Series
◽
10.1088/1742-6596/126/1/012097
◽
2008
◽
Vol 126
◽
pp. 012097
◽
Cited By ~ 2
Author(s):
H K Edwards
◽
S C Coe
◽
M W Fay
◽
C A Scotchford
◽
D M Grant
◽
...
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Focused Ion Beam
◽
Ion Beam
◽
Beam Scanning
◽
Cross Sectional
◽
Site Specific
◽
Cross Sectional Imaging
◽
Sectional Imaging
◽
Scanning Electron
Download Full-text
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10.1016/j.polymer.2005.09.060
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Resolving physical interactions between bacteria and nanotopographies with focused ion beam scanning electron microscopy.
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Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy
Langmuir
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10.1021/acs.langmuir.0c00034
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Focused ion beam scanning electron microscopy in biology
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10.1111/jmi.12127
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2014
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pp. 109-114
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Correlative In Vivo 2 Photon and Focused Ion Beam Scanning Electron Microscopy of Cortical Neurons
PLoS ONE
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10.1371/journal.pone.0057405
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Electron Microscopy
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Scanning Electron Microscopy
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Focused Ion Beam
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AMST: Alignment to Median Smoothed Template for Focused Ion Beam Scanning Electron Microscopy Image Stacks
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10.1038/s41598-020-58736-7
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Degradation profiles in aged EPDM water seals using focused ion beam-scanning electron microscopy
Polymer Degradation and Stability
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10.1016/j.polymdegradstab.2013.08.027
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Correlative In Vivo 2-Photon Imaging and Focused Ion Beam Scanning Electron Microscopy
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Three-Dimensional Microstructure of ε-Fe2O3 Crystals in Ancient Chinese Sauce Glaze Porcelain Revealed by Focused Ion Beam Scanning Electron Microscopy
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A FAIR Principle Data Model for Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) and the Frederick National Laboratory Data Coordinating Center
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