scholarly journals Modeling and Resource Classification Lateritic Nickel Deposits on a Heterogeneous Block in The Haul-Sagu Area using Estimation and Simulation Geostatistical Method

2020 ◽  
Vol 1569 ◽  
pp. 042079
Author(s):  
W A K Conoras ◽  
A A Lamburu
2016 ◽  
Vol 46 (2) ◽  
pp. 261-273 ◽  
Author(s):  
João Gabriel Motta ◽  
Ilio Rodarte Faria Júnior

ABSTRACT: Southwestern São Francisco Craton makes limit with Brasília thrust-fold belt and involves rocks from Archean to formed during the Brasiliano-Pan Africano Neoproterozoic event, including a mafic-ultramafic belt (Morro do Ferro Greenstone Belt) hosted along the Archean counterpart. This greenstone belt hosts two-nickel deposits (Morro do Níquel and O'Toole, respectively silicate and sulfide types) and occurrences. This study applies an empirical-conceptual model for lateritic nickel deposits formation into geographic information systems with aerogeophysical data (magnetic and gamma-spectrometry) and digital elevation models (terrain relief and slope). Our contribution aims for nickel deposits favorability mapping using a simple mathematical operator over a supporting spatial database translating the conceptual exploration model into evidential layers for geological processes involved on deposit formation. Evidential layers constructed for identification of elements pertaining the supergene nickel mineral system are given by analytic signal amplitude maps, thorium over potassium ratio images, and digital elevation models and slope maps, derived from shuttle radar topography mission digital elevation models. Evidential layers integration through binary layers algebraic sum identified effectively known deposits and occurrences with its outputs highlighting possibilities for unknown resources in this under-explored terrain.


1992 ◽  
Vol 27 (2) ◽  
pp. 137-146 ◽  
Author(s):  
S. M. Barros de Oliveira ◽  
J. J. Trescases ◽  
A. José Melfi

Author(s):  
C. W. Price ◽  
E. F. Lindsey

Thickness measurements of thin films are performed by both energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence (XRF). XRF can measure thicker films than EDS, and XRF measurements also have somewhat greater precision than EDS measurements. However, small components with curved or irregular shapes that are used for various applications in the the Inertial Confinement Fusion program at LLNL present geometrical problems that are not conducive to XRF analyses but may have only a minimal effect on EDS analyses. This work describes the development of an EDS technique to measure the thickness of electroless nickel deposits on gold substrates. Although elaborate correction techniques have been developed for thin-film measurements by x-ray analysis, the thickness of electroless nickel films can be dependent on the plating bath used. Therefore, standard calibration curves were established by correlating EDS data with thickness measurements that were obtained by contact profilometry.


2017 ◽  
Vol 10 ◽  
pp. 478-485 ◽  
Author(s):  
Abishek B. Kamaraj ◽  
Hirdayesh Shrestha ◽  
Emily Speck ◽  
Murali Sundaram

Author(s):  
Fajar Nurjaman ◽  
Widi Astuti ◽  
Fathan Bahfie ◽  
Bambang Suharno

1977 ◽  
Vol 72 (7) ◽  
pp. 1195-1223 ◽  
Author(s):  
F. M. Barrett ◽  
R. A. Binns ◽  
D. I. Groves ◽  
R. J. Marston ◽  
K. G. McQueen

1992 ◽  
Vol 43 (3) ◽  
pp. 231-232
Author(s):  
Yutaka TSURU ◽  
Yoshihiro NAKAMURA ◽  
Kunisuke HOSOKAWA

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