scholarly journals The radiation tolerance of specific optical fibres exposed to 650 kGy(Si) of ionizing radiation

2009 ◽  
Vol 4 (07) ◽  
pp. P07010-P07010 ◽  
Author(s):  
B Arvidsson ◽  
K Dunn ◽  
C Issever ◽  
B T Huffman ◽  
M Jones ◽  
...  
Author(s):  
Vinicius Vono Peruzzi ◽  
William Souza da Cruz ◽  
Gabriel Augusto da Silva ◽  
Ricardo Cotrim Teixeira ◽  
Luis Eduardo Seixas Junior ◽  
...  

2020 ◽  
Vol 104 ◽  
pp. 113554 ◽  
Author(s):  
K. Muthuseenu ◽  
H.J. Barnaby ◽  
A. Patadia ◽  
K. Holbert ◽  
A. Privat

2008 ◽  
Vol 20 (10) ◽  
pp. 104216 ◽  
Author(s):  
E Farhi ◽  
C Rivasseau ◽  
M Gromova ◽  
E Compagnon ◽  
V Marzloff ◽  
...  

1995 ◽  
Vol 42 (6) ◽  
pp. 1558-1566 ◽  
Author(s):  
J.A. Babcock ◽  
J.D. Cressler ◽  
L.S. Vempati ◽  
S.D. Clark ◽  
R.C. Jaeger ◽  
...  

2018 ◽  
Vol 31 (1) ◽  
pp. 131-140
Author(s):  
Andrey Petrov ◽  
Alexander Nikiforov ◽  
Anna Boruzdina ◽  
Anastasia Ulanova ◽  
Andrey Yanenko

In this work we investigate the influence of various memory chips supply voltage on their sensitivity to the radiation environment. The main physical mechanisms responsible for radiation-induced degradation at nominal, increased, and decreased supply voltage values are discussed. It is demonstrated that, depending on supply voltage value during irradiation and subsequent testing, device's tolerance to data corruption effects in memory circuits, single event latch-up (SEL) and hard errors induced by ionizing radiation can vary significantly. We also give some recommendations to perform radiation tests.


1995 ◽  
Vol 16 (8) ◽  
pp. 351-353 ◽  
Author(s):  
J.A. Babcock ◽  
J.D. Cressler ◽  
L.S. Vempati ◽  
S.D. Clark ◽  
R.C. Jaeger ◽  
...  

Author(s):  
Yanhua Luo ◽  
Desheng Fan ◽  
Mingjie Ding ◽  
Qiancheng Zhao ◽  
Binbin Yan ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document