New Mass Spec Method for Blood and Urine Screening

2014 ◽  
Vol 34 (5) ◽  
pp. 20-21 ◽  
Author(s):  
Justin M. Wiseman ◽  
Nicholas E. Manicke
Keyword(s):  
1993 ◽  
Vol 2 (3) ◽  
pp. 207-211 ◽  
Author(s):  
Andrew J. Saxon ◽  
Donald A. Calsyn ◽  
Diane Greenberg ◽  
Paul Blaes ◽  
Virginia M. Haver ◽  
...  
Keyword(s):  

2020 ◽  
Vol 129 ◽  
pp. 39-52
Author(s):  
Grzegorz Zwierzchowski ◽  
Guanshi Zhang ◽  
Rupasri Mandal ◽  
David S. Wishart ◽  
Burim N. Ametaj

2021 ◽  
Vol 7 (1) ◽  
pp. 18
Author(s):  
Christiane Auray-Blais ◽  
Michel Boutin ◽  
Pamela Lavoie ◽  
Bruno Maranda

The Quebec Neonatal Urine Screening Program was initiated in 1971 with overall screening inception of newborns in 1973. Forty-seven years later, over 3.5 million babies have been screened for up to 25 inborn errors of metabolism divided into two groups: (1) urea cycle disorders and organic acidurias; and (2) disorders of amino acid metabolism and transport. The main goal of this preventive genetic medicine program is the detection of treatable diseases before the onset of clinical symptoms. Urine specimens from 21-day-old babies are collected and dried on filter paper by parents at home. The participation is voluntary with a high compliance rate over the years (~90%). Specimens are analyzed by thin layer chromatography (TLC). The main objective of this evaluative research project was to assess the feasibility of a technological upgrade towards mass spectrometry. A 2.85-min flow injection method was devised, normal values established, and abnormal profiles confirmed using second-tier tests. The validated assays are sensitive, specific, and suitable for populational screening, as well as for high-risk screening laboratories. Triple H syndrome, which would not be detected in newborns by blood screening at two days of age was found to be positive in the urine of an affected patient.


1993 ◽  
Vol 39 (4) ◽  
pp. 698-699 ◽  
Author(s):  
D Simpson ◽  
D R Jarvie ◽  
F M Moore

1991 ◽  
Vol 235 ◽  
Author(s):  
Ying Wu ◽  
W. Savin ◽  
T. Fink ◽  
N. M. Ravindra ◽  
R. T. Lareau ◽  
...  

ABSTRACTExperimental analysis and simulation of the formation and electrical characterization of TiSi2/+/p-Si shallow junctions are presented here. The formation of shallow n+-p junction, by ion implantation of As through Ti films evaporated on p-Si substrates followed by Rapid Thermal Annealing (RTA) and conventional furnace annealing has been performed in these experiments. Structural techniques such as Secondary Ion Mass Spec-troscopy (SIMS) and Rutherford Backscattering (RBS) experiments have been employed to characterize these devices. RUMP simulations were used to analyze and interpret the RBS data. Current-voltage characteristics have been simulated using PISCES simulator.


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