scholarly journals A frequency domain analysis of the error distribution from noisy high-frequency data

Biometrika ◽  
2018 ◽  
Vol 105 (2) ◽  
pp. 353-369
Author(s):  
Jinyuan Chang ◽  
Aurore Delaigle ◽  
Peter Hall ◽  
Cheng Yong Tang
Keyword(s):  
Frequency Domain ◽  
High Frequency ◽  
Domain Analysis ◽  
Frequency Domain Analysis ◽  
Error Distribution ◽  
High Frequency Data ◽  
Frequency Data

High-Frequency TSV Failure Detection Method with Z Parameter

2012 ◽  
Author(s):  
Joohee Kim ◽  
Daniel H. Jung ◽  
Jonghyun Cho ◽  
Jun So Pak ◽  
Joungho Kim ◽  
...  
Keyword(s):  
Frequency Domain ◽  
High Frequency ◽  
Detection Method ◽  
Failure Detection ◽  
Domain Analysis ◽  
Frequency Domain Analysis ◽  
Z Parameter ◽  
Die Stacking ◽  
Failure Types

Abstract As the TSV count increases, chip yield can be severely degraded due to failures during the TSV or die-stacking processes. This paper will present and discuss on the usage of failure masks designed to detect and differentiate failure types such as connection failure and insulator failure based on frequency-domain one point probing measurement. The failure masks are proposed on the basis of the frequency domain analysis of TSV failures with Z11 magnitudes.

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