scholarly journals Mapping structure and morphology of amorphous organic thin films by 4D-STEM pair distribution function analysis

Microscopy ◽  
2019 ◽  
Vol 68 (4) ◽  
pp. 301-309 ◽  
Author(s):  
Xiaoke Mu ◽  
Andrey Mazilkin ◽  
Christian Sprau ◽  
Alexander Colsmann ◽  
Christian Kübel

Abstract Imaging the phase distribution of amorphous or partially crystalline organic materials at the nanoscale and analyzing the local atomic structure of individual phases has been a long-time challenge. We propose a new approach for imaging the phase distribution and for analyzing the local structure of organic materials based on scanning transmission electron diffraction (4D-STEM) pair distribution function analysis (PDF). We show that electron diffraction based PDF analysis can be used to characterize the short- and medium-range order in aperiodically packed organic molecules. Moreover, we show that 4D-STEM-PDF does not only provide local structural information with a resolution of a few nanometers, but can also be used to image the phase distribution of organic composites. The distinct and thickness independent contrast of the phase image is generated by utilizing the structural difference between the different types of molecules and taking advantage of the dose efficiency due to use of the full scattering signal. Therefore, this approach is particularly interesting for imaging unstained organic or polymer composites without distinct valence states for electron energy loss spectroscopy. We explore the possibilities of this new approach using [6,6]-phenyl-C61- butyric acid methyl ester (PC61BM) and poly(3-hexylthiophene-2,5-diyl) (P3HT) as the archetypical and best-investigated semiconductor blend used in organic solar cells, compare our phase distribution with virtual dark-field analysis and validate our approach by electron energy loss spectroscopy.

1983 ◽  
Vol 25 ◽  
Author(s):  
J.C. Barbour ◽  
L.A. Grunes ◽  
J.W. Mayer

ABSTRACTVariations in the valence and core level electron energy loss spectroscopy (EELS) peaks are studied as a function of nickel silicide composition.Analysis of the EELS spectra in comparison with the electron diffraction patterns show the plasmon energies fingerprint the silicide phases. The EELS core level spectra reflect the Si bonding and the electronic density of states in each phase.Irradiated Ni 2Si becomes amorphous causing a change in the plasmon peak energy and the Si L23peaks.


1997 ◽  
Vol 04 (03) ◽  
pp. 525-534 ◽  
Author(s):  
HARRY A. ATWATER ◽  
C. C. AHN ◽  
S. S. WONG ◽  
G. HE ◽  
H. YOSHINO ◽  
...  

Energy-filtered reflection high energy electron diffraction and reflection electron energy loss spectroscopy expand the usefulness of reflection high energy electron diffraction for quantitative structure determination and surface spectroscopy during film growth. Several implementations of energy-filtered reflection high energy electron diffraction are discussed, along with the progress and prospects for structure determination. New developments in parallel detection reflection electron energy loss spectroscopy (PREELS) enable the use of this method to obtain surface-spectroscopic information in real time during thin film growth, greatly expanding the range of surface information available during growth.


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