High-resolution electron microscopy study of defect structures in -TiAl irradiated with 15 keV He ions in a high-voltage transmission electron microscope
1999 ◽
Vol 48
(4)
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pp. 355-360
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1993 ◽
Vol 8
(5)
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pp. 1019-1027
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2007 ◽
Vol 558-559
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pp. 993-996
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1986 ◽
Vol 116
(1)
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pp. 63-72
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1983 ◽
Vol 93
(2)
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pp. 449-450
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