scholarly journals Genetic mapping of northern corn leaf blight-resistant quantitative trait loci in maize

Medicine ◽  
2020 ◽  
Vol 99 (31) ◽  
pp. e21326
Author(s):  
Haifeng Xia ◽  
Wei Gao ◽  
Jing Qu ◽  
Liqiang Dai ◽  
Yan Gao ◽  
...  
2021 ◽  
Vol 11 ◽  
Author(s):  
Hosahally Muddrangappa Ranganatha ◽  
Hirenallur Chandappa Lohithaswa ◽  
Anand Pandravada

Among various foliar diseases affecting maize yields worldwide, northern corn leaf blight (NCLB) is economically important. The genetics of resistance was worked out to be quantitative in nature thereby suggesting the need for the detection of quantitative trait loci (QTL) to initiate effective marker-aided breeding strategies. From the cross CML153 (susceptible) × SKV50 (resistant), 344 F2:3 progenies were derived and screened for their reaction to NCLB during the rainy season of 2013 and 2014. The identification of QTL affecting resistance to NCLB was carried out using the genetic linkage map constructed with 194 polymorphic SNPs and the disease data recorded on F2:3 progeny families. Three QTL for NCLB resistance were detected on chromosomes 2, 5, and 8 with the QTL qNCLB-8-2 explaining the highest phenotypic variation of 16.34% followed by qNCLB-5 with 10.24%. QTL for resistance to sorghum downy mildew (SDM) and southern corn rust (SCR) were also identified from one season phenotypic data, and the co-location of QTL for resistance to three foliar diseases was investigated. QTL present in chromosome bins 8.03, 5.03, 5.04, and 3.04 for resistance to NCLB, SDM, and SCR were co-localized, indicating their usefulness for the pyramiding of quantitative resistance to multiple foliar pathogens. Marker-assisted selection was practiced in the crosses CM212 × SKV50, HKI162 × SKV50, and CML153 × SKV50 employing markers linked to major QTL on chromosomes 8, 2, and 10 for NCLB, SDM, and SCR resistance, respectively. The populations were advanced to F6 stage to derive multiple disease-resistant inbred lines. Out of the 125 lines developed, 77 lines were tested for their combining ability and 39 inbred lines exhibited high general combining ability with an acceptable level of resistance to major diseases.


2001 ◽  
Vol 91 (3) ◽  
pp. 293-300 ◽  
Author(s):  
A. F. Brown ◽  
J. A. Juvik ◽  
J. K. Pataky

Partial resistance to Stewart's wilt (Erwina stewartii, syn. Pantoea stewartii), northern corn leaf blight (NCLB) (Exserohilum turcicum), and common rust (Puccinia sorghi) was observed in an F2:3 population developed from a cross between the inbred sweet corn lines IL731a and W6786. The objective of this study was to identify quantitative trait loci (QTL) associated with partial resistance using restriction fragment length polymorphic markers. Phenotypic data were collected for 2 years for Stewart's wilt, NCLB, and common rust but, due to significant family-environment interaction, analysis was conducted individually on data from each year. In 2 years of evaluation for the three diseases, a total of 33 regions in the maize genome were associated with partial resistance describing from 5.9 to 18% of the total phenotypic variability. Of six regions common in both years, three were associated with partial resistance to Stewart's wilt (chromosomes 4:07, 5:03, and 6:04), one was associated with NCLB (chromosome 9:05), and two were associated with common rust (chromosomes 2:04 and 3:04). The rust QTL on 3S mapped to within 20 cM of the rp3 locus and explained 17.7% of the phenotypic variability. Some of the QTL associated with partial resistance to the three diseases have been reported previously, and some are described here for the first time. Results suggest it may be possible to consolidate QTL from various elite backgrounds in a manner analogous to the pyramiding of major resistance genes. We also report here on two QTL associated with anthocyanin production on chromosomes 10:6 and 5:03 in the general location of the a2 gene.


2010 ◽  
Vol 130 (3) ◽  
pp. 372-382 ◽  
Author(s):  
Arwa Shahin ◽  
Paul Arens ◽  
Adriaan W. Van Heusden ◽  
Gerard Van Der Linden ◽  
Martijn Van Kaauwen ◽  
...  

2011 ◽  
Vol 123 (2) ◽  
pp. 307-326 ◽  
Author(s):  
Chia-Lin Chung ◽  
Jesse Poland ◽  
Kristen Kump ◽  
Jacqueline Benson ◽  
Joy Longfellow ◽  
...  

Author(s):  
T. Millán ◽  
E. Madrid ◽  
P. Castro ◽  
J. Gil ◽  
J. Rubio

2009 ◽  
Vol 99 (5) ◽  
pp. 540-547 ◽  
Author(s):  
Godfrey Asea ◽  
Bindiganavile S. Vivek ◽  
George Bigirwa ◽  
Patrick E. Lipps ◽  
Richard C. Pratt

Maize production in sub-Saharan Africa incurs serious losses to epiphytotics of foliar diseases. Quantitative trait loci conditioning partial resistance (rQTL) to infection by causal agents of gray leaf spot (GLS), northern corn leaf blight (NCLB), and maize streak have been reported. Our objectives were to identify simple-sequence repeat (SSR) molecular markers linked to consensus rQTL and one recently identified rQTL associated with GLS, and to determine their suitability as tools for selection of improved host resistance. We conducted evaluations of disease severity phenotypes in separate field nurseries, each containing 410 F2:3 families derived from a cross between maize inbred CML202 (NCLB and maize streak resistant) and VP31 (a GLS-resistant breeding line) that possess complimentary rQTL. F2:3 families were selected for resistance based on genotypic (SSR marker), phenotypic, or combined data and the selected F3:4 families were reevaluated. Phenotypic values associated with SSR markers for consensus rQTL in bins 4.08 for GLS, 5.04 for NCLB, and 1.04 for maize streak significantly reduced disease severity in both generations based on single-factor analysis of variance and marker-interval analysis. These results were consistent with the presence of homozygous resistant parent alleles, except in bin 8.06, where markers were contributed by the NCLB-susceptible parent. Only one marker associated with resistance could be confirmed in bins 2.09 (GLS) and 3.06 (NCLB), illustrating the need for more robust rQTL discovery, fine-mapping, and validation prior to undertaking marker-based selection.


2009 ◽  
Vol 88 (3) ◽  
pp. 477-482 ◽  
Author(s):  
Y. Uemoto ◽  
S. Sato ◽  
S. Odawara ◽  
H. Nokata ◽  
Y. Oyamada ◽  
...  

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