scholarly journals Stabilizing the ion-beam transmission through tapered glass capillaries

2021 ◽  
Vol 103 (5) ◽  
Author(s):  
E. Giglio ◽  
M. Léger
Keyword(s):  
Ion Beam ◽  
Glass Capillaries ◽  
Beam Transmission

Optimal Sample Preparation to Characterize Corrosion in Historical Photographs with Analytical TEM

2014 ◽  
Vol 20 (5) ◽  
pp. 1585-1590
Author(s):  
Eva Grieten ◽  
Joost Caen ◽  
Dominique Schryvers
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Metallic Nanoparticles ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Soft Matrix ◽  
Transmission Electron ◽  
Traditional Preparation ◽  
Beam Transmission ◽  
Historical Photographs

AbstractAn alternative focused ion beam preparation method is used for sampling historical photographs containing metallic nanoparticles in a polymer matrix. We use the preparation steps of classical ultra-microtomy with an alternative final sectioning with a focused ion beam. Transmission electron microscopy techniques show that the lamella has a uniform thickness, which is an important factor for analytical transmission electron microscopy. Furthermore, the method maintains the spatial distribution of nanoparticles in the soft matrix. The results are compared with traditional preparation techniques such as ultra-microtomy and classical focused ion beam milling.

Effect of preacceleration on intense ion‐beam transmission efficiency

1978 ◽  
Vol 33 (4) ◽  
pp. 278-279 ◽  
Author(s):  
J. H. Whealton ◽  
C. C. Tsai ◽  
W. K. Dagenhart ◽  
W. L. Gardner ◽  
H. H. Haselton ◽  
...  
Keyword(s):  
Ion Beam ◽  
Transmission Efficiency ◽  
Beam Transmission

Investigation of the deformation behavior in nanoindented metal/nitride multilayers by coupling FIB-TEM and AFM observations

2005 ◽  
Vol 880 ◽  
Author(s):  
G. Abadias ◽  
C. Tromas ◽  
Y.Y. Tse ◽  
A. Michel
Keyword(s):  
Deformation Behavior ◽  
Focused Ion Beam ◽  
Mechanical Response ◽  
Ion Beam ◽  
Dislocation Motion ◽  
Ion Beam Sputtering ◽  
Force Microscopy ◽  
Transmission Electron ◽  
Beam Sputtering ◽  
Beam Transmission

AbstractEpitaxial TiN/Cu bilayers and multilayers with periods L between 5 and 50 nm have been grown by ultrahigh vacuum ion beam sputtering on Si and MgO(001) substrates at room temperature. The deformation modes induced by a Berkovich nanoindent have been imaged using Focused Ion Beam – Transmission Electron Microscopy (FIB-TEM) and Atomic Force Microscopy (AFM). The observations suggest that the mechanical response of the multilayers is essentially governed by an extensive plastic flow inside the Cu layers, which is confined by a bending of the more rigid TiN layers. This specific deformation behavior, with no contribution of the interfaces as a barrier for dislocation motion could explain the absence of significant hardness enhancement in this system.

An Investigation of Au-Ag Interface Formed by Cold Welding Using Focused Ion Beam/Transmission Electron Microscopy

2006 ◽  
Vol 965 ◽  
Author(s):  
Yifang Cao ◽  
Nan Yao ◽  
Kevin McIlwrath ◽  
Jikou Zhou ◽  
Gabriel Osinkolu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Dust Particles ◽  
Cold Welding ◽  
Transmission Electron ◽  
Beam Transmission

ABSTRACTThis paper reports the recent results of a transmission electron microscopy study of cold-welded and e-beam deposited Au-Ag interfaces. Dust particles were observed to be embedded between the cold-welded interfaces. These are shown to amplify the defect regions caused by surface asperities. Electron energy loss spectroscopy (EELS) analysis revealed that there was no significant diffusion zone across the cold welding interface. However, sub-micron mechanical twining structures were revealed by transmission electron microscopy (TEM) analyses. These were found to penetrate through both the cold-welded and control Au-Ag interfaces, but with different orientations.

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