Measurements of theK-shell ionization cross sections of Si by 3–25-keV electron impact using the thick-target method
Keyword(s):
2006 ◽
Vol 246
(2)
◽
pp. 281-287
◽
2008 ◽
Vol 266
(23)
◽
pp. 5037-5040
◽
2001 ◽
Vol 18
(4)
◽
pp. 531-532
◽
2001 ◽
Vol 18
(6)
◽
pp. 759-760
◽
Keyword(s):
2005 ◽
Vol 37
(3)
◽
pp. 361-369
◽
Keyword(s):
2011 ◽
Vol 2
(2)
◽
pp. 109-116
Keyword(s):
2002 ◽
pp. 233-236
◽
Keyword(s):