Thick-target method in the measurement of inner-shell ionization cross-sections by low-energy electron impact

Author(s):  
Z. An ◽  
Y. Wu ◽  
M.T. Liu ◽  
Y.M. Duan ◽  
C.H. Tang
2020 ◽  
Vol 98 (10) ◽  
pp. 970-975
Author(s):  
L.X. Tian ◽  
C.C. Dai ◽  
Y.J. Liu

The measurements of K-shell ionization cross sections for Fe, Ni, and Zn were performed using 7–29 keV electron impact on thick targets. Monte Carlo simulations were employed to correct the effects due to the multiple-scattered electrons and bremsstrahlung photons as well as other secondary particles within the thick targets. The so-called Tikhonov regularization method was adopted to deal with the ill-posed inverse problem involved in the thick-target method. The experimental results were compared with the DWBA and PWBA-C-Ex predictions as well as existing experimental data from the literature. It is observed that our experimental data are in better agreement with the theoretical results based on the DWBA model developed by Bote et al.


2005 ◽  
Vol 22 (9) ◽  
pp. 2244-2247 ◽  
Author(s):  
Gou Cheng-Jun ◽  
Wu Zhang-Wen ◽  
Yang Dai-Lun ◽  
He Fu-Qing ◽  
Peng Xiu-Feng ◽  
...  

2006 ◽  
Vol 12 (S02) ◽  
pp. 844-845
Author(s):  
X Llovet ◽  
C Merlet ◽  
D Bote ◽  
JM Fernández-Varea ◽  
F Salvat

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006


2011 ◽  
Vol 58 (6) ◽  
pp. 3219-3245 ◽  
Author(s):  
Hee Seo ◽  
Maria Grazia Pia ◽  
Paolo Saracco ◽  
Chan Hyeong Kim

Sign in / Sign up

Export Citation Format

Share Document