Effect of surface roughness on the measurement of electron impact inner-shell ionization cross sections using thick-target method

2008 ◽  
Vol 266 (23) ◽  
pp. 5037-5040 ◽  
Author(s):  
LiXia Tian ◽  
Zhu An
Keyword(s):  
Surface Roughness ◽  
Electron Impact ◽  
Cross Sections ◽  
Thick Target ◽  
Ionization Cross ◽  
Inner Shell Ionization ◽  
Ionization Cross Sections ◽  
Shell Ionization ◽  
Effect Of Surface

Measurements of K-shell ionization cross sections of Fe, Ni, and Zn by 7–29 keV electron impact using the thick-target method

2020 ◽  
Vol 98 (10) ◽  
pp. 970-975
Author(s):  
L.X. Tian ◽  
C.C. Dai ◽  
Y.J. Liu
Keyword(s):  
Experimental Data ◽  
Electron Impact ◽  
Cross Sections ◽  
Thick Target ◽  
Tikhonov Regularization Method ◽  
Ionization Cross ◽  
Bremsstrahlung Photons ◽  
Ill Posed ◽  
Ionization Cross Sections ◽  
Shell Ionization

The measurements of K-shell ionization cross sections for Fe, Ni, and Zn were performed using 7–29 keV electron impact on thick targets. Monte Carlo simulations were employed to correct the effects due to the multiple-scattered electrons and bremsstrahlung photons as well as other secondary particles within the thick targets. The so-called Tikhonov regularization method was adopted to deal with the ill-posed inverse problem involved in the thick-target method. The experimental results were compared with the DWBA and PWBA-C-Ex predictions as well as existing experimental data from the literature. It is observed that our experimental data are in better agreement with the theoretical results based on the DWBA model developed by Bote et al.

scholarly journals New Measurements and Calculations of Inner-shell Ionization Cross Sections by Electron Impact

2006 ◽  
Vol 12 (S02) ◽  
pp. 844-845
Author(s):  
X Llovet ◽  
C Merlet ◽  
D Bote ◽  
JM Fernández-Varea ◽  
F Salvat
Keyword(s):  
Electron Impact ◽  
Cross Sections ◽  
Ionization Cross ◽  
Inner Shell Ionization ◽  
Ionization Cross Sections ◽  
Shell Ionization

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

The measurement of inner-shell ionization cross aections by electron impact in a TEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1266-1267
Author(s):  
Raynald Gauvin ◽  
Gilles L'Espérance
Keyword(s):  
Electron Impact ◽  
Cross Sections ◽  
Weight Fraction ◽  
Thin Foil ◽  
Specimen Thickness ◽  
Ionization Cross ◽  
Electron Dose ◽  
Total Electron ◽  
Inner Shell Ionization ◽  
Shell Ionization

Values of cross sections for ionization of inner-shell electrons by electron impact are required for electron probe microanalysis, Auger-electron spectroscopy and electron energy-loss spectroscopy. In this work, the results of the measurement of inner-shell ionization cross-sections by electron impact, Q, in a TEM are presented for the K shell.The measurement of QNi has been performed at 120 KeV in a TEM by measuring the net X-ray intensity of the Kα line of Ni, INi, which is related to QNi by the relation :(1)where i is the total electron dose, (Ω/4π)is the fractional solid angle, ω is the fluorescence yield, α is the relative intensity factor, ε is the Si (Li) detector efficiency, A is the atomic weight, ρ is the sample density, No is Avogadro's number, t' is the distance traveled by the electrons in the specimen which is equal to τ sec θ neglecting beam broadening where τ is the specimen thickness and θ is the angle between the electron beam and the normal of the thin foil and CNi is the weight fraction of Ni.

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