An introduction to X-ray Intensity Fluctuation Spectroscopy (XIFS) is given by
describing its relationship to speckle from coherent sources. A brief description of the relationship
of XIFS measurements to the underlying equations of motion is given. Preliminary results for the
charge density wave (CDW) system NbSe3 are then presented. Static speckle patterns are shown for
the $\overrightarrow {Q}_1 = (0 .76$ 0) CDW peak showing that XIFS experiments are possible in this systom provided
time constants are long enough. For electrical currents below threshold, a static speckle pattern is
observed but for currents above threshold the speckles are smeared out showing movement of the
CDW. It is also shown that above threshold, the longitudinal correlation length decreases.
X-ray study of the charge-density-wave transition in single-layer
TiSe2