Direct Measurement of the Thickness-Dependent Electronic Band Structure ofMoS2Using Angle-Resolved Photoemission Spectroscopy

2013 ◽  
Vol 111 (10) ◽  
Author(s):  
Wencan Jin ◽  
Po-Chun Yeh ◽  
Nader Zaki ◽  
Datong Zhang ◽  
Jerzy T. Sadowski ◽  
...  
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