Misfit Dislocation Structure for Close-Packed Metal-Metal Interfaces

1995 ◽  
Vol 75 (5) ◽  
pp. 882-885 ◽  
Author(s):  
J. C. Hamilton ◽  
S. M. Foiles
Keyword(s):  
Dislocation Structure ◽  
Misfit Dislocation ◽  
Metal Metal ◽  
Metal Interfaces

scholarly journals Atomic-Scale Determination of Misfit Dislocation Loops at Metal-Metal Interfaces

1995 ◽  
Vol 75 (3) ◽  
pp. 489-492 ◽  
Author(s):  
J. Jacobsen ◽  
L. Pleth Nielsen ◽  
F. Besenbacher ◽  
I. Stensgaard ◽  
E. Lægsgaard ◽  
...  
Keyword(s):  
Misfit Dislocation ◽  
Atomic Scale ◽  
Dislocation Loops ◽  
Metal Metal ◽  
Metal Interfaces

Annealing effects on the plasmonic excitations of metal/metal interfaces

2009 ◽  
Vol 255 (11) ◽  
pp. 6038-6042 ◽  
Author(s):  
A. Politano ◽  
V. Formoso ◽  
G. Chiarello
Keyword(s):  
Metal Metal ◽  
Annealing Effects ◽  
Metal Interfaces

The Role of Misfit Dislocation During Epitaxial Growth

1987 ◽  
Vol 94 ◽  
Author(s):  
D. Cherns
Keyword(s):  
Misfit Dislocation ◽  
Lattice Spacing ◽  
Minimum Energy ◽  
Energy Criterion ◽  
Misfit Dislocations ◽  
Metal Metal ◽  
Correct Account ◽  
Pseudomorphic Growth ◽  
Dislocation Sources

ABSTRACTThe theory of Frank and van der Merwe (FM) in 1949 showed that a minimum energy criterion could explain the pseudomorphic growth of a deposit on a substrate of different lattice spacing and the subsequent relief of strain by misfit dislocations as the deposit thickness increases. Although the “equilibrium” theory is qualitatively correct, account must be taken of actual dislocation sources, which may be complex, and which may be more or less efficient for misfit relief than predicted by the FM model. Moreover, misfit dislocation sources may determine the morphology of the growing film, the interface topology and even the atomic structure of the deposit/substrate interface. These various roles of misfit dislocations are reviewed here with examples from work on metal/metal, semiconductor/semiconductor and metal/semiconductor systems.

Thermal conductance of metal-metal interfaces

2005 ◽  
Vol 72 (24) ◽  
Author(s):  
Bryan C. Gundrum ◽  
David G. Cahill ◽  
Robert S. Averback
Keyword(s):  
Thermal Conductance ◽  
Metal Metal ◽  
Metal Interfaces
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