Angular Dependence of Domain Wall Resistivity in Artificial Magnetic Domain Structures

ABSTRACTMagnetic domain structures in Fe-3wt%Si alloy have been observed by a Kerr microscopy to understand the interaction between the magnetic domain wall and grain boundaries. It was found that the domain structures in the vicinity of the grain boundary depend on the misorientation angle; the high angle random boundary disturbs the magnetic domain structure more than the low angle boundary. In addition to the misorientation angle, magnetic domain structures were affected by the inclination of the grain boundary plane. Moreover, dynamic observations of rearrangement of the magnetic domain structure during magnetization revealed that grain boundaries could act as the sink and/or the source for magnetic domains.

Download Full-text

Magnetic domain structures, domain wall energies and magnetization processes in UFe10Si2 and UCo10Si2 intermetallic compounds

Journal of the Less Common Metals ◽

10.1016/0022-5088(90)90090-7 ◽

1990 ◽

Vol 163 (1) ◽

pp. 115-121 ◽

Cited By ~ 15

Author(s):

J.J. Wysłocki ◽

W. Suski ◽

A. Baran

Keyword(s):

Domain Wall ◽

Intermetallic Compounds ◽

Magnetic Domain ◽

Domain Structures ◽

Magnetization Processes

Download Full-text

Angular dependence of domain wall resistivity inSrRuO3films

Physical Review B ◽

10.1103/physrevb.67.134436 ◽

2003 ◽

Vol 67 (13) ◽

Cited By ~ 15

Author(s):

Michael Feigenson ◽

Lior Klein ◽

James W. Reiner ◽

Malcolm R. Beasley

Keyword(s):

Domain Wall ◽

Angular Dependence ◽

Wall Resistivity

Download Full-text

The direct determination of magnetic domain wall profiles using a split detector STEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100109471 ◽

1978 ◽

Vol 36 (1) ◽

pp. 466-467

Author(s):

J.N. Chapman ◽

P.E. Batson ◽

E.M. Waddell ◽

R.P. Ferrier

Keyword(s):

Electron Microscope ◽

Domain Wall ◽

Transmission Electron Microscope ◽

Domain Walls ◽

Photographic Plate ◽

Magnetic Domain ◽

Direct Determination ◽

Quantitative Information ◽

Scanning Transmission Electron Microscope ◽

Transmission Electron

By far the most commonly used mode of Lorentz microscopy in the examination of ferromagnetic thin films is the Fresnel or defocus mode. Use of this mode in the conventional transmission electron microscope (CTEM) is straightforward and immediately reveals the existence of all domain walls present. However, if such quantitative information as the domain wall profile is required, the technique suffers from several disadvantages. These include the inability to directly observe fine image detail on the viewing screen because of the stringent illumination coherence requirements, the difficulty of accurately translating part of a photographic plate into quantitative electron intensity data, and, perhaps most severe, the difficulty of interpreting this data. One solution to the first-named problem is to use a CTEM equipped with a field emission gun (FEG) (Inoue, Harada and Yamamoto 1977) whilst a second is to use the equivalent mode of image formation in a scanning transmission electron microscope (STEM) (Chapman, Batson, Waddell, Ferrier and Craven 1977), a technique which largely overcomes the second-named problem as well.

Download Full-text

Temperature Dependence of Magnetic Domains and Wall Structures

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010009573x ◽

1972 ◽

Vol 30 ◽

pp. 496-497

Author(s):

Sonoko Tsukahara ◽

Tadami Taoka ◽

Hisao Nishizawa

Keyword(s):

Temperature Dependence ◽

Domain Walls ◽

Magnetic Domain ◽

Iron Film ◽

Objective Lens ◽

Lorentz Microscopy ◽

Domain Structures ◽

Wall Structures ◽

Crystal Films ◽

Metallurgical Structure

The high voltage Lorentz microscopy was successfully used to observe changes with temperature; of domain structures and metallurgical structures in an iron film set on the hot stage combined with a goniometer. The microscope used was the JEM-1000 EM which was operated with the objective lens current cut off to eliminate the magnetic field in the specimen position. Single crystal films with an (001) plane were prepared by the epitaxial growth of evaporated iron on a cleaved (001) plane of a rocksalt substrate. They had a uniform thickness from 1000 to 7000 Å.The figure shows the temperature dependence of magnetic domain structure with its corresponding deflection pattern and metallurgical structure observed in a 4500 Å iron film. In general, with increase of temperature, the straight domain walls decrease in their width (at 400°C), curve in an iregular shape (600°C) and then vanish (790°C). The ripple structures with cross-tie walls are observed below the Curie temperature.

Download Full-text

Numerical Analysis of a Magnetic Domain Wall in a Magnetic Nanocontact

Journal of the Magnetics Society of Japan ◽

10.3379/jmsjmag.29.116 ◽

2005 ◽

Vol 29 (2) ◽

pp. 116-119

Author(s):

T. Komine ◽

T. Takahashi ◽

R. Sugita ◽

T. Muranoi ◽

Y. Hasegawa

Keyword(s):

Numerical Analysis ◽

Domain Wall ◽

Magnetic Domain ◽

Magnetic Domain Wall

Download Full-text

Highlights in the history of X-ray topography1

Zeitschrift für Kristallographie - Crystalline Materials ◽

10.1524/zkri.1995.210.6.394 ◽

1995 ◽

Vol 210 (6) ◽

Author(s):

A. R. Lang

Keyword(s):

Magnetic Domain ◽

Diffraction Theory ◽

Dislocation Loops ◽

X Ray Diffraction ◽

X Ray ◽

Domain Structures ◽

Structure Factors ◽

History Of ◽

Dislocation Sources ◽

Non Destructive

AbstractX-ray topography provides a non-destructive method of mapping point-by-point variations in orientation and reflecting power within crystals. The discovery, made by several workers independently, that in nearly perfect crystals it was possible to detect individual dislocations by X-ray diffraction contrast started an epoch of rapid exploitation of X-ray topography as a new, general method for assessing crystal perfection. Another discovery, that of X-ray Pendellösung, led to important theoretical developments in X-ray diffraction theory and to a new and precise method for measuring structure factors on an absolute scale. Other highlights picked out for mention are studies of Frank-Read dislocation sources, the discovery of long dislocation helices and lines of coaxial dislocation loops in aluminium, of internal magnetic domain structures in Fe-3 wt.% Si, and of stacking faults in silicon and natural diamonds.

Download Full-text

Magnetic properties of (Bi1−xLax)(Fe,Co)O3 films fabricated by a pulsed DC reactive sputtering and demonstration of magnetization reversal by electric field

Scientific Reports ◽

10.1038/s41598-021-90547-2 ◽

2021 ◽

Vol 11 (1) ◽

Author(s):

Munusamy Kuppan ◽

Daichi Yamamoto ◽

Genta Egawa ◽

Sivaperuman Kalainathan ◽

Satoru Yoshimura

Keyword(s):

Electric Field ◽

Magnetization Reversal ◽

High Performance ◽

Magnetic Domain ◽

Magnetic Film ◽

Film Plane ◽

Force Microscopy ◽

Domain Structures ◽

Pulsed Dc ◽

Submicron Scale

Abstract(Bi1−xLax)(Fe,Co)O3 multiferroic magnetic film were fabricated using pulsed DC (direct current) sputtering technique and demonstrated magnetization reversal by applied electric field. The fabricated (Bi0.41La0.59)(Fe0.75Co0.25)O3 films exhibited hysteresis curves of both ferromagnetic and ferroelectric behavior. The saturated magnetization (Ms) of the multiferroic film was about 70 emu/cm3. The squareness (S) (= remanent magnetization (Mr)/Ms) and coercivity (Hc) of perpendicular to film plane are 0.64 and 4.2 kOe which are larger compared with films in parallel to film plane of 0.5 and 2.5 kOe. The electric and magnetic domain structures of the (Bi0.41La0.59)(Fe0.75Co0.25)O3 film analyzed by electric force microscopy (EFM) and magnetic force microscopy (MFM) were clearly induced with submicron scale by applying a local electric field. This magnetization reversal indicates the future realization of high performance magnetic device with low power consumption.

Download Full-text