High-resolution transmission electron microscopy study of the φ′- and δ-AlON spinel phases of the pseudo-binary section AlN–Al2O3

1999 ◽  
Vol 32 (4) ◽  
pp. 755-760 ◽  
Author(s):  
P. Tabary ◽  
C. Servant ◽  
M. Guymont

A previously proposed structural model [Tabary & Servant (1999).J. Appl. Cryst.32, 253–272] for the φ′- and δ-AlON spinel phases, which allows for the double modulation of composition and displacement of cations and anions and which describes both phases and their relationships to the γ-AlON spinel phase, is here supported by high-resolution electron microscopy observations.

1980 ◽  
Vol 2 ◽  
Author(s):  
Fernando A. Ponce

ABSTRACTThe structure of the silicon-sapphire interface of CVD silicon on a (1102) sapphire substrate has been studied in crøss section by high resolution transmission electron microscopy. Multibeam images of the interface region have been obtained where both the silicon and sapphire lattices are directly resolved. The interface is observed to be planar and abrupt to the instrument resolution limit of 3 Å. No interfacial phase is evident. Defects are inhomogeneously distributed at the interface: relatively defect-free regions are observed in the silicon layer in addition to regions with high concentration of defects.


1983 ◽  
Vol 76 (2) ◽  
pp. K109-K111 ◽  
Author(s):  
D. Sundararaman ◽  
A. L. E. Terrance ◽  
G. van Teneloo ◽  
J. van Landuyt

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