Determination of stress/strain profiles in implanted ferrimagnetic garnet epitaxial layers by plane wave X-ray methods

1984 ◽  
Vol 40 (a1) ◽  
pp. C320-C320
Author(s):  
J. Miltat
1983 ◽  
Vol 22 (Part 2, No. 3) ◽  
pp. L151-L153
Author(s):  
Kohtaro Ishida ◽  
Yoshinori Kobayashi ◽  
Hiroyuki Katoh ◽  
Satio Takagi
Keyword(s):  

1963 ◽  
Vol 7 ◽  
pp. 542-554
Author(s):  
Frank L. Chan

AbstractRecently, interest in the determination of selenium in trace amounts has been greatly intensified because of the nutritional aspects of this element. It has been reported that selenium in the amount of 13 μg in the form of sodium selenite in 100 g of feed has an effect similar to that of vitamin E. In the field of semiconductors, the detection and determination of trace amounts of selenium in arsenic, antimony, and small single crystals of solid solution of cadmium selenide and sulfide are of considerable importance in semiconductor performance.In the Aerospace Research Laboratories, 4,5 diamino-6-tbiopyi-imidine has been successfully adopted as a reagent for the spectrophotometric determination of selenium. The reaction of 4,5 diamino-6-thiopyrimidine and tetxavalent selenium produces a yellow color with the formation of elemental selenium. It is possible to determine elemental selenium by collecting it in a thin layer. The selenium deposited in this layer may then be determined by an X-ray fluorescence method. A procedure of this nature has the advantage of eliminating the matrix effects commonly encountered in X-ray fluorescence. Furthermore, the slow generation of selenium affords a convenient means of detection and confirmation of this element by the use of X-ray diffraction procedures. By this technique selenium is first converted to its tetravalent state and is then reacted with 4,5 diamino-6-thiopyrimidine. On standing, the selenium is reduced to a red precipitate of elemental selenium which can be dissolved in carbon disulfide. Finally, the selenium can be converted into its hexagonal structure by annealing at 205-207°C.


Author(s):  
F. A. Bannister

Concentrates from the platiniferous norites of the Bushveld, Transvaal, are not completely soluble in aqua regia. The insoluble portion consists of steel-grey fragments first analysed chemically by R. A. Cooper and considered by him to be a new platinum mineral represented by the formula Pt(As,S)2. The name cooperite was proposed for the new mineral by F. Wartenweiller, and after further work Cooper decided that the arsenic found in the early analysis was due to the presence of sperrylite, and he changed the formula to PtS2. H. Schneiderhöhn observed simple twinning and, less frequently, polysynthetie lamellae on polished sections of mineral grains from the same deposits, and he suggested that cooperite is probably orthorhombic and isomorphous with marcasite. The latest account of the new mineral has been published by H. R. Adam who gave several analyses of cooperite from the Rustenburg and Potgietersrust districts and concluded that the ‘mineral is PtS2 with a small amount of excess metal (platinum, palladium, and nickel) present in solid solution’.


The first study of meteoric iron by X-ray methods was undertaken at the instigation of Professor S. W. J. Smith, F.R.S. some years ago. This research (Young 1926) resulted not only in the determination of the crystal structures of two of the main constituents, kamacite and taenite, but also in the important discovery of the nature of the mutual orientations of these constituents when the meteorite exhibits a Widmanstätten structure. As is well known, the Widmanstätten figures in meteorites arise from the arrangement of kamacite lamellae on the planes of an octahedron, and for that reason a meteorite exhibiting these figures is generally referred to as an octahedrite. The kamacite lamellae, therefore, fix the {I I I}-planes of a hypothetical cubic lattice whose principal axes, XYZ , will be referred to as “ the axes of the octahedrite”.


2015 ◽  
Vol 591 ◽  
pp. 215-218 ◽  
Author(s):  
S. Daniš ◽  
Z. Matĕj ◽  
L. Matĕjová ◽  
M. Krupka

1993 ◽  
Vol 308 ◽  
Author(s):  
I. C. Noyan ◽  
G. Sheikh

ABSTRACTThe mechanical response of a specimen incorporating thin films is dictated by a combination of fundamental mechanical parameters such as Young's moduli of the individual layers, and by configurational parameters such as adhesion strength at the interface(s), residual stress distribution and other process dependent factors. In most systems, the overall response will be dominated by the properties of the (much thicker) substrate. Failure within the individual layers, on the other hand, is dependent on the local strain distributions and can not be predicted from the substrate values alone. To better understand the mechanical response of these systems, the strain within the individual layers of the thin film system must be measured and correlated with applied stresses. Phase selectivity of X-ray stress/strain analysis techniques is well suited for this purpose. In this paper, we will review the use of the traditional x-ray stress/strain analysis methods for the determination of the mechanical properties of thin film systems.


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