scholarly journals Capability of insulator study by photoemission electron microscopy at SPring-8

2013 ◽  
Vol 20 (4) ◽  
pp. 620-625 ◽  
Author(s):  
Takuo Ohkochi ◽  
Masato Kotsugi ◽  
Keisuke Yamada ◽  
Kenji Kawano ◽  
Koji Horiba ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Magnetic Domain ◽  
Film Surface ◽  
Ground Level ◽  
X Rays ◽  
Photoemission Electron Microscopy ◽  
Area Of Interest ◽  
Resolution Imaging ◽  
Observation Method ◽  
Photoemission Electron

The observation method of photoemission electron microscopy (PEEM) on insulating samples has been established in an extremely simple way. Surface conductivity is induced locally on an insulating surface by continuous radiation of soft X-rays, and Au films close to the area of interest allow the accumulated charges on the insulated area to be released to ground level. Magnetic domain observations of a NiZn ferrite, local X-ray absorption spectroscopy of sapphire, high-resolution imaging of a poorly conducting Li0.9CoO2film surface, and Au pattern evaporation on a fine rock particle are demonstrated. Using this technique, all users' experiments on poorly conducting samples have been performed successfully at the PEEM experimental station of SPring-8.

scholarly journals Multiplicity of magnetic domain states in circular elements probed by photoemission electron microscopy

2005 ◽  
Vol 72 (22) ◽  
Author(s):  
C. A. F. Vaz ◽  
M. Kläui ◽  
L. J. Heyderman ◽  
C. David ◽  
F. Nolting ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Magnetic Domain ◽  
Photoemission Electron Microscopy ◽  
Photoemission Electron

Time-resolved magnetic domain imaging by x-ray photoemission electron microscopy

2003 ◽  
Vol 82 (14) ◽  
pp. 2299-2301 ◽  
Author(s):  
J. Vogel ◽  
W. Kuch ◽  
M. Bonfim ◽  
J. Camarero ◽  
Y. Pennec ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Magnetic Domain ◽  
Time Resolved ◽  
Photoemission Electron Microscopy ◽  
X Ray ◽  
Photoemission Electron

Investigation of Damage area on DLC film surface using X-ray Photoemission Electron Microscopy

2019 ◽  
Vol 2019.27 (0) ◽  
pp. 206
Author(s):  
Hiroki Akasaka ◽  
Sarayut Tunmee ◽  
Ukit Rittihong ◽  
Masashi Tomidokoro ◽  
Chanan Euaruksakul ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Film Surface ◽  
Photoemission Electron Microscopy ◽  
X Ray ◽  
Dlc Film ◽  
Damage Area ◽  
Photoemission Electron

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

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