scholarly journals X-ray optics and beam characterization using random modulation: experiments

2020 ◽  
Vol 27 (2) ◽  
pp. 293-304 ◽  
Author(s):  
Sebastien Berujon ◽  
Ruxandra Cojocaru ◽  
Pierre Piault ◽  
Rafael Celestre ◽  
Thomas Roth ◽  
...  

A parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad. 27, 284–292] reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. Shown here are experimental applications of the technique for characterizing both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with a minimum amount of wavefront distortion. It is also recalled how such methods can facilitate online optimization of active optics.

2020 ◽  
Vol 27 (2) ◽  
pp. 284-292 ◽  
Author(s):  
Sebastien Berujon ◽  
Ruxandra Cojocaru ◽  
Pierre Piault ◽  
Rafael Celestre ◽  
Thomas Roth ◽  
...  

X-ray near-field speckle-based phase-sensing approaches provide efficient means of characterizing optical elements. Presented here is a theoretical review of several of these speckle methods within the framework of optical characterization, and a generalization of the concept is provided. As is also demonstrated experimentally in a parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad. 27, (this issue)], the methods theoretically developed here can be applied to different beams and optics and within a variety of situations where at-wavelength metrology is desired. By understanding the differences between the various processing methods, it is possible to find and implement the most suitable approach for each metrology scenario.


2013 ◽  
Author(s):  
Christian G. Schroer ◽  
Florian-Emanuel Brack ◽  
Roman Brendler ◽  
Susanne Hönig ◽  
Robert Hoppe ◽  
...  

2011 ◽  
Author(s):  
Timo T. Saha ◽  
Scott Rohrbach ◽  
William W. Zhang ◽  
Tyler C. Evans ◽  
Melinda Hong

2015 ◽  
Vol 22 (2) ◽  
pp. 342-347
Author(s):  
P. Oberta ◽  
M. Kittler ◽  
V. Áč ◽  
J. Hrdý ◽  
N. Iragashi ◽  
...  

A study of metallic brazing material for internally cooled optics is presented. The study shows the influence of the different material properties on the final quality of the bond in terms of diffracted wavefront distortion,i.e.enlargement of the rocking curve. By choosing the proper brazing material and applying the proper brazing conditions, the influence of the brazing material can be fully eliminated. Furthermore the degradation of some brazing material due to the extreme working conditions of the optics is presented. Measurement results from ESRF and KEK confirm the importance of the proper brazing material choice.


2014 ◽  
Author(s):  
Ryan Allured ◽  
Vincenzo Cotroneo ◽  
Raegan Johnson-Wilke ◽  
Vanessa Marquez ◽  
Stuart McMuldroch ◽  
...  
Keyword(s):  

2019 ◽  
Vol 26 (1) ◽  
pp. 45-51 ◽  
Author(s):  
Simon G. Alcock ◽  
Ioana-Theodora Nistea ◽  
Riccardo Signorato ◽  
Robin L. Owen ◽  
Daniel Axford ◽  
...  

The tangential curvature of actively bent X-ray mirrors at synchrotron radiation and X-ray free-electron laser (XFEL) facilities is typically only changed every few hours or even days. This operation can take tens of minutes for active optics with multiple bending actuators and often requires expert guidance using in situ monitoring devices. Hence, the dynamic performance of active X-ray optics for synchrotron beamlines has historically not been exploited. This is in stark contrast to many other scientific fields. However, many areas of synchrotron radiation and XFEL science, including macromolecular crystallography, could greatly benefit from the ability to change the size and shape of the X-ray beam rapidly and continuously. The advantages of this innovative approach are twofold: a large reduction in the dead time required to change the size of the X-ray beam for different-sized samples and the possibility of making multiple changes to the beam during the measurement of a single sample. In the preceding paper [Part I; Alcock, Nistea, Signorato & Sawhney (2019), J. Synchrotron Rad. 26, 36–44], which accompanies this article, high-speed visible-light Fizeau interferometry was used to identify the factors which influence the dynamic bending behaviour of piezoelectric bimorph deformable X-ray mirrors. Building upon this ex situ metrology study, provided here is the first synchrotron radiation beamline implementation of high-speed adaptive X-ray optics using two bimorphs operating as a Kirkpatrick–Baez pair. With optimized substrates, novel opto-mechanical holders and a next-generation high-voltage power supply, the size of an X-ray beam was rapidly and repeatedly switched in <10 s. Of equal importance, it is also shown that compensation of piezoelectric creep ensures that the X-ray beam size remains stable for more than 1 h after making a major change. The era of high-speed adaptive X-ray optics for synchrotron radiation and XFEL beamlines has begun.


Author(s):  
G.E. Ice

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.


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