Diffuse multiple scattering

A new form of diffraction lines has been identified, similar to Rutherford, Kikuchi and Kossel lines. This paper highlights some of the properties of these lines and shows how they can be used to eliminate the need for sample/source matching in Lonsdale's triple convergent line method in lattice-parameter determination.

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Problems Associated with Kα Doublet in Residual Stress Measurements

Advances in X-ray Analysis ◽

10.1154/s0376030800006492 ◽

1979 ◽

Vol 23 ◽

pp. 333-339

Author(s):

S. K. Gupta ◽

B. D. Cullity

Keyword(s):

Residual Stress ◽

Silicon Powder ◽

Lattice Parameter ◽

Diffraction Peak ◽

Parameter Determination ◽

X Ray Diffraction ◽

X Ray ◽

Analysis Techniques ◽

The Difference ◽

Similar Accuracy

Since the measurement of residual stress by X-ray diffraction techniques is dependent on the difference in angle of a diffraction peak maximum when the sample is examined consecutively with its surface at two different angles to the diffracting planes, it is important that these diffraction angles be obtained precisely, preferably with an accuracy of ± 0.01 deg. 2θ. Similar accuracy is desired in precise lattice parameter determination. In such measurements, it is imperative that the diffractometer be well-aligned. It is in the context of diffractometer alignment with the aid of a silicon powder standard free of residual stress that the diffraction peak analysis techniques described here have been developed, preparatory to residual stress determinations.

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An automatic four-circle diffractometer designed for precise lattice-parameter determination

Journal of Applied Crystallography ◽

10.1107/s0021889892013086 ◽

1993 ◽

Vol 26 (3) ◽

pp. 467-467 ◽

Cited By ~ 4

Author(s):

D. Kucharczyk ◽

A. Pietraszko ◽

K. Łukaszewicz

Keyword(s):

Lattice Parameter ◽

Parameter Determination

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Lattice Parameter Determination using Synchrotron Powder Data

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-1935-1_45 ◽

1987 ◽

pp. 373-382 ◽

Cited By ~ 3

Author(s):

W. Parrish ◽

M. Hart ◽

T. C. Huang ◽

M. Bellotto

Keyword(s):

Lattice Parameter ◽

Parameter Determination

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Local Lattice Parameter Determination of Strained Areas of Semiconductors Using CBED

Microscopy and Microanalysis ◽

10.1017/s1431927604883727 ◽

2004 ◽

Vol 10 (S02) ◽

pp. 310-311

Author(s):

Takayuki Akaogi ◽

Kenji Tsuda ◽

Masami Terauchi ◽

Michiyoshi Tanaka

Keyword(s):

Lattice Parameter ◽

Parameter Determination ◽

Local Lattice

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Precision Lattice Parameter Determination at Liquid Helium Temperatures by Double-Scanning Diffractometry

Advances in X-ray Analysis ◽

10.1154/s0376030800004523 ◽

1966 ◽

Vol 10 ◽

pp. 354-365 ◽

Cited By ~ 7

Author(s):

Hubert W. King ◽

Carolyn M. Preece

Keyword(s):

Liquid Helium ◽

Lattice Parameter ◽

Lattice Parameters ◽

Parameter Determination ◽

Double Scanning ◽

Cryogenic Temperatures ◽

Included Angle ◽

X Ray ◽

Standard Specimens ◽

Alignment Errors

AbstractThe back-reflect ion double-scanning diffractometer method, by which lattice parameters can be measured with a reproducibility of one part in 150,000 has been applied at liquid helium temperatures. A cryostat attachment is described which enables diffraction profiles to be scanned on both sides of the primary X-ray beam up to 163°, 2θ. Alignment errors may, thus, be eliminated by measuring the included angle 4θ between respective Bragg reflections. The method is illustrated by measuring the lattice parameters of the I.U.Cr. standard specimens of silicon and tungsten at various cryogenic temperatures.

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