scholarly journals Pushing the limits of material characterization using transmission electron microscopy at the University of Oviedo

2018 ◽  
Vol 74 (a2) ◽  
pp. e316-e316
Author(s):  
Zakariae Amghouz ◽  
Alaa Adawy ◽  
José R. García ◽  
Santiago García-Granda
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Material Characterization ◽  
Transmission Electron ◽  
The University

The 1-MeV Electron Microscope Installation at the University of Colorado

1973 ◽  
Vol 31 ◽  
pp. 8-9 ◽  
Author(s):  
Mircea Fotino
Keyword(s):  
Electron Microscopy ◽  
Developmental Biology ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
National Institutes Of Health ◽  
Experimental Program ◽  
University Of Colorado ◽  
Transmission Electron ◽  
The University ◽  
Research Resources

A new 1-MeV transmission electron microscope (Model JEM-1000) was installed at the Department of Molecular, Cellular and Developmental Biology of the University of Colorado in Boulder during the summer and fall of 1972 under the sponsorship of the Division of Research Resources of the National Institutes of Health. The installation was completed in October, 1972. It is installed primarily for the study of biological materials without many of the limitations hitherto unavoidable in standard transmission electron microscopy. Only the technical characteristics of the installation are briefly reviewed here. A more detailed discussion of the experimental program under way is being published elsewhere.

scholarly journals Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp

Materials ◽  
2018 ◽  
Vol 11 (8) ◽  
pp. 1304 ◽  
Author(s):  
Giulio Guzzinati ◽  
Thomas Altantzis ◽  
Maria Batuk ◽  
Annick De Backer ◽  
Gunnar Lumbeeck ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Materials Science ◽  
Electron Tomography ◽  
High Resolution Imaging ◽  
Rapid Progress ◽  
Transmission Electron ◽  
The World ◽  
Resolution Imaging ◽  
The University

The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among the largest in the world, EMAT is continuously contributing to the development of TEM techniques, such as high-resolution imaging, diffraction, electron tomography, and spectroscopies, with an emphasis on quantification and reproducibility, as well as employing TEM methodology at the highest level to solve real-world materials science problems. The lab’s recent contributions are presented here together with specific case studies in order to highlight the usefulness of TEM to the advancement of materials science.

A new species of aplanosporic Haptoglossa, H. beakesii, with vesiculate spore release

Botany ◽  
2010 ◽  
Vol 88 (1) ◽  
pp. 93-101 ◽  
Author(s):  
S. L. Glockling ◽  
L. C. Serpell
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
New Species ◽  
Light Microscopy ◽  
Dense Body ◽  
Central Nucleus ◽  
Transmission Electron ◽  
Spore Release ◽  
The University ◽  
A New Species

A new species of Haptoglossa , Haptoglossa beakesii sp. nov., a nematode parasite found in a sample of compost and rabbit dung at the University of Sussex campus, is described. The species, which infects nematodes of the genus Rhabditis , is unusual because it releases non-motile spores into a retaining vesicle. Aspects of the development and reproduction of the species are illustrated with light microscopy and transmission electron microscopy (TEM). TEM revealed a typical multinucleate thallus which cleaved into un-walled aplanospore initials. Each aplanospore contained a central nucleus closely surrounded by mitochondria and with peripheral dense body vesicles (DBV) and distinctive, layered, encystment vesicles. Aplanospores were expelled into a fine vesicle which later broke down to release cysts. Cysts germinated to produce infective gun cells.

scholarly journals Using a Formvar-Coated Bridge to Apply Formvar Support Film to TEM Grids

1999 ◽  
Vol 7 (5) ◽  
pp. 18-19
Author(s):  
John P. Shields
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Conventional Method ◽  
Serial Sections ◽  
University Of Georgia ◽  
Alternative Method ◽  
Transmission Electron ◽  
Ultrathin Sections ◽  
The University

One conventional method for picking up ultrathin sections for transmission electron microscopy (TEM) is to prepare the mesh or slot grids with a formvar support film and then pick up your sections as they are floating in the knife boat. An alternative method is to first pick up sections on a naked grid and then lay them down on formvar film suspended over holes drilled in an aluminum bridge. I use this method when picking up serial sections on slot grids. A description of the method follows. The bridges I have were manufactured at the University of Georgia instrumentation Shop. They can also be purchased pre-made (for example, from SPI, Inc. They list them as Domino Racks), or one can make them from aluminum with a vise and drill. The sample bridge in the figure is similar to what I use. It is 5 cm long, 2.5 cm wide.

Controlled Environment Transmission Electron Microscopy

1999 ◽  
Vol 589 ◽  
Author(s):  
I. M. Robertson
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Hydrogen Embrittlement ◽  
Controlled Environment ◽  
Basic Design ◽  
University Of Illinois ◽  
Transmission Electron ◽  
The One ◽  
The University

AbstractThe basic design features of a controlled environment transmission electron microscope and the details of the one at the University of Illinois are described. Examples of how this instrument has been used to determine fundamental mechanisms of hydrogen embrittlement in metals are presented.

Techniques for Transmission Electron Microscopy of Fiber-Matrix Interfaces in Aluminum Alloy-Boron Composites by Ion Erosio

1971 ◽  
Vol 29 ◽  
pp. 204-205
Author(s):  
G. G. Shaw
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Aluminum Alloy ◽  
Electron Beam ◽  
Pure Aluminum ◽  
Ion Milling ◽  
Transmission Electron ◽  
Fiber Matrix ◽  
Ion Erosion ◽  
Row Of Fibers

The morphology and composition of the fiber-matrix interface can best be studied by transmission electron microscopy and electron diffraction. For some composites satisfactory samples can be prepared by electropolishing. For others such as aluminum alloy-boron composites ion erosion is necessary.When one wishes to examine a specimen with the electron beam perpendicular to the fiber, preparation is as follows: A 1/8 in. disk is cut from the sample with a cylindrical tool by spark machining. Thin slices, 5 mils thick, containing one row of fibers, are then, spark-machined from the disk. After spark machining, the slice is carefully polished with diamond paste until the row of fibers is exposed on each side, as shown in Figure 1.In the case where examination is desired with the electron beam parallel to the fiber, preparation is as follows: Experimental composites are usually 50 mils or less in thickness so an auxiliary holder is necessary during ion milling and for easy transfer to the electron microscope. This holder is pure aluminum sheet, 3 mils thick.

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