A physical interpretation for the single-event-gate-rupture cross-section of n-channel power MOSFETs

1996 ◽  
Vol 43 (6) ◽  
pp. 2932-2937 ◽  
Author(s):  
G.H. Johnson ◽  
K.F. Galloway ◽  
R.D. Schrimpf ◽  
J.L. Titus ◽  
C.F. Wheatley ◽  
...  
Keyword(s):  
Cross Section ◽  
Physical Interpretation ◽  
Single Event ◽  
Channel Power ◽  
Power Mosfets

Simulation aided hardening of N-channel power MOSFETs to prevent single event burnout

1995 ◽  
Vol 42 (6) ◽  
pp. 1935-1939 ◽  
Author(s):  
C. Dachs ◽  
F. Roubaud ◽  
J.-M. Palau ◽  
G. Bruguier ◽  
J. Gasiot ◽  
...  
Keyword(s):  
Single Event ◽  
Channel Power ◽  
Power Mosfets

Measurement of a cross-section for single-event gate rupture in power MOSFETs

1996 ◽  
Vol 17 (4) ◽  
pp. 163-165 ◽  
Author(s):  
I. Mouret ◽  
P. Calvel ◽  
M. Allenspach ◽  
J.L. Titus ◽  
C.F. Wheatley ◽  
...  
Keyword(s):  
Cross Section ◽  
Single Event ◽  
Power Mosfets

Temperature dependence of single-event burnout in n-channel power MOSFETs (for space application)

1992 ◽  
Vol 39 (6) ◽  
pp. 1605-1612 ◽  
Author(s):  
G.H. Johnson ◽  
R.D. Schrimpf ◽  
K.F. Galloway ◽  
R. Koga
Keyword(s):  
Temperature Dependence ◽  
Space Application ◽  
Single Event ◽  
Channel Power ◽  
Power Mosfets

Experimental and 2D simulation study of the single-event burnout in N-channel power MOSFETs

1993 ◽  
Vol 40 (6) ◽  
pp. 1952-1958 ◽  
Author(s):  
F. Roubaud ◽  
C. Dachs ◽  
J.-M. Palau ◽  
J. Gasiot ◽  
P. Tastet
Keyword(s):  
Simulation Study ◽  
Single Event ◽  
Channel Power ◽  
Power Mosfets ◽  
2D Simulation

Mechanism for single-event burnout of power MOSFETs and its characterization technique

1992 ◽  
Vol 39 (6) ◽  
pp. 1698-1703 ◽  
Author(s):  
S. Kuboyama ◽  
S. Matsuda ◽  
T. Kanno ◽  
T. Ishii
Keyword(s):  
Single Event ◽  
Power Mosfets ◽  
Characterization Technique

Laser cross section measurement for the evaluation of single-event effects in integrated circuits

2000 ◽  
Vol 40 (8-10) ◽  
pp. 1371-1375 ◽  
Author(s):  
V. Pouget ◽  
P. Fouillat ◽  
D. Lewis ◽  
H. Lapuyade ◽  
F. Darracq ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Cross Section ◽  
Single Event ◽  
Cross Section Measurement ◽  
Single Event Effects ◽  
Section Measurement
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