Mechanism for single-event burnout of power MOSFETs and its characterization technique
1992 ◽
Vol 39
(6)
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pp. 1698-1703
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2020 ◽
Vol 67
(9)
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pp. 3698-3704
Keyword(s):
1989 ◽
Vol 36
(6)
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pp. 2260-2266
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2011 ◽
Vol 58
(6)
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pp. 2739-2747
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1994 ◽
Vol 41
(6)
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pp. 2152-2159
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1995 ◽
Vol 42
(6)
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pp. 1935-1939
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