Effect of material interactions during thermal shock testing on IC package reliability

1993 ◽  
Vol 16 (8) ◽  
pp. 932-939 ◽  
Author(s):  
A.S. Chen ◽  
L.T. Nguyen ◽  
S.A. Gee
2015 ◽  
Vol 30 (12) ◽  
pp. 1261
Author(s):  
ZHANG Xiao-Feng ◽  
ZHOU Ke-Song ◽  
ZHANG Ji-Fu ◽  
ZHANG Yong ◽  
LIU Min ◽  
...  

Carbon ◽  
1982 ◽  
Vol 20 (2) ◽  
pp. 156
Author(s):  
S. Sato ◽  
K. Kawamata ◽  
J. Aizawa ◽  
M. Ishii

2006 ◽  
Vol 15-17 ◽  
pp. 633-638 ◽  
Author(s):  
Jong Woong Kim ◽  
Hyun Suk Chun ◽  
Sang Su Ha ◽  
Jong Hyuck Chae ◽  
Jin Ho Joo ◽  
...  

Board-level reliability of conventional Sn-37Pb and Pb-free Sn-3.0Ag-0.5Cu solder joints was evaluated using thermal shock testing. In the microstructural investigation of the solder joints, the formation of Cu6Sn5 intermetallic compound (IMC) layer was observed between both solders and Cu lead frame, but any crack or newly introduced defect cannot be found even after 2000 cycles of thermal shocks. Shear test of the multi layer ceramic capacitor (MLCC) joints were also conducted to investigate the effect of microstructural variations on the bonding strength of the solder joints. Shear forces of the both solder joints decreased with increasing thermal shock cycles. The reason to the decrease in shear force was discussed with fracture surfaces of the shear tested solder joints.


Carbon ◽  
1969 ◽  
Vol 7 (6) ◽  
pp. 732
Author(s):  
R.D Reiswig ◽  
P.E Armstrong ◽  
L.S Levinson

1982 ◽  
Vol 17 (9) ◽  
pp. 2553-2559 ◽  
Author(s):  
K. Niihara ◽  
J. P. Singh ◽  
D. P. H. Hasselman

1989 ◽  
Vol 67 (1) ◽  
pp. 95-98 ◽  
Author(s):  
D. R. Bury ◽  
D. R. Eastham

Author(s):  
V. Knoblauch ◽  
G. A. Schneider ◽  
W. Dreßler ◽  
H. Böder ◽  
G. Schneider ◽  
...  

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