Two-dimensional potential profile measurement of GaAs HEMT's by Kelvin probe force microscopy

IEEE Electron Device Letters ◽

10.1109/55.622517 ◽

1997 ◽

Vol 18 (9) ◽

pp. 423-425 ◽

Author(s):

T. Mizutani ◽

M. Arakawa ◽

S. Kishimoto

Keyword(s):

Kelvin Probe Force Microscopy ◽

Potential Profile ◽

Profile Measurement ◽

Two Dimensional ◽

Kelvin Probe ◽

Force Microscopy

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Potential profile measurement of GaAs MESFETs passivated with low-temperature grown GaAs layer by Kelvin probe force microscopy

Solid-State Electronics ◽

10.1016/s0038-1101(99)00102-1 ◽

1999 ◽

Vol 43 (8) ◽

pp. 1547-1553 ◽

Author(s):

K Matsunami ◽

T Takeyama ◽

T Usunami ◽

S Kishimoto ◽

K Maezawa ◽

...

Keyword(s):

Low Temperature ◽

Kelvin Probe Force Microscopy ◽

Potential Profile ◽

Profile Measurement ◽

Kelvin Probe ◽

Force Microscopy ◽

Low Temperature Grown Gaas

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Potential profile measurement of cleaved surface of GaAs HEMTs by Kelvin probe force microscopy

International Electron Devices Meeting. Technical Digest ◽

10.1109/iedm.1996.553115 ◽

2002 ◽

Author(s):

T. Mizutani ◽

M. Arakawa ◽

S. Kishimoto

Keyword(s):

Kelvin Probe Force Microscopy ◽

Potential Profile ◽

Profile Measurement ◽

Kelvin Probe ◽

Force Microscopy

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Potential Profile Measurement of GaAs HEMTs and Heterostructures Using Kelvin Probe Force Microscopy.

Hyomen Kagaku ◽

10.1380/jsssj.20.9 ◽

1999 ◽

Vol 20 (1) ◽

pp. 9-13

Author(s):

Takashi MIZUTANI

Keyword(s):

Kelvin Probe Force Microscopy ◽

Potential Profile ◽

Profile Measurement ◽

Kelvin Probe ◽

Force Microscopy

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Imaging the Photocarrier Dynamics in Organic, Hybrid and Two-Dimensional Photovoltaic Materials by Time-Resolved Kelvin Probe Force Microscopy

10.29363/nanoge.fallmeeting.2018.014 ◽

2018 ◽

Author(s):

Benjamin GREVIN

Keyword(s):

Kelvin Probe Force Microscopy ◽

Two Dimensional ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Organic Hybrid ◽

Photovoltaic Materials

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Investigation of the cleaved surface of a p–i–n laser using Kelvin probe force microscopy and two-dimensional physical simulations

Applied Physics Letters ◽

10.1063/1.126513 ◽

2000 ◽

Vol 76 (20) ◽

pp. 2907-2909 ◽

Author(s):

F. Robin ◽

H. Jacobs ◽

O. Homan ◽

A. Stemmer ◽

W. Bächtold

Keyword(s):

Kelvin Probe Force Microscopy ◽

Two Dimensional ◽

Kelvin Probe ◽

Force Microscopy ◽

Physical Simulations

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Potential profile evaluation of a diamond lateral p-n junction diode using Kelvin probe force microscopy

physica status solidi (a) ◽

10.1002/pssa.201532251 ◽

2015 ◽

Vol 212 (11) ◽

pp. 2589-2594

Author(s):

Kazuya Shirota ◽

Daisuke Takeuchi ◽

Hiromitsu Kato ◽

Toshiharu Makino ◽

Masahiko Ogura ◽

...

Keyword(s):

Kelvin Probe Force Microscopy ◽

Potential Profile ◽

Kelvin Probe ◽

Force Microscopy ◽

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Study of Two Dimensional Electron Gas Formation at AlGaN/GaNInterfaces using Kelvin Probe Force Microscopy

Journal of Self-Assembly and Molecular Electronics (SAME) ◽

10.13052/jsame2245-4551.2018019 ◽

2018 ◽

Vol 6 (1) ◽

pp. 1-1

Author(s):

P. Caban ◽

R. Thorpe ◽

L. Feldman ◽

K. Pedersen ◽

V. N. Popok ◽

...

Keyword(s):

Electron Gas ◽

Kelvin Probe Force Microscopy ◽

Two Dimensional ◽

Dimensional Electron ◽

Kelvin Probe ◽

Two Dimensional Electron Gas ◽

Force Microscopy ◽

Gas Formation ◽

Dimensional Electron Gas

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Two-dimensional junction identification in multicrystalline silicon solar cells by scanning Kelvin probe force microscopy

Journal of Applied Physics ◽

10.1063/1.3003131 ◽

2008 ◽

Vol 104 (10) ◽

pp. 104501 ◽

Author(s):

C.-S. Jiang ◽

H. R. Moutinho ◽

R. Reedy ◽

M. M. Al-Jassim ◽

A. Blosse

Keyword(s):

Solar Cells ◽

Kelvin Probe Force Microscopy ◽

Multicrystalline Silicon ◽

Silicon Solar Cells ◽

Two Dimensional ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Potential profile and photovoltaic effect in nanoscale lateral pn junction observed by Kelvin probe force microscopy

Thin Solid Films ◽

10.1016/j.tsf.2013.08.115 ◽

2014 ◽

Vol 557 ◽

pp. 249-253 ◽

Author(s):

Roland Nowak ◽

Daniel Moraru ◽

Takeshi Mizuno ◽

Ryszard Jablonski ◽

Michiharu Tabe

Keyword(s):

Photovoltaic Effect ◽

Kelvin Probe Force Microscopy ◽

Potential Profile ◽

Kelvin Probe ◽

Force Microscopy ◽

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Imaging the Photocarrier Dynamics in Organic, Hybrid and Two-Dimensional Photovoltaic Materials by Time-Resolved Kelvin Probe Force Microscopy

10.29363/nanoge.nfm.2018.014 ◽

2018 ◽

Author(s):

Benjamin GREVIN

Keyword(s):

Kelvin Probe Force Microscopy ◽

Two Dimensional ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Organic Hybrid ◽

Photovoltaic Materials

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