Potential profile and photovoltaic effect in nanoscale lateral pn junction observed by Kelvin probe force microscopy

2014 ◽  
Vol 557 ◽  
pp. 249-253 ◽  
Author(s):  
Roland Nowak ◽  
Daniel Moraru ◽  
Takeshi Mizuno ◽  
Ryszard Jablonski ◽  
Michiharu Tabe
Keyword(s):  
Photovoltaic Effect ◽  
Kelvin Probe Force Microscopy ◽  
Potential Profile ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Pn Junction

Potential profile evaluation of a diamond lateral p-n junction diode using Kelvin probe force microscopy

2015 ◽  
Vol 212 (11) ◽  
pp. 2589-2594
Author(s):  
Kazuya Shirota ◽  
Daisuke Takeuchi ◽  
Hiromitsu Kato ◽  
Toshiharu Makino ◽  
Masahiko Ogura ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Potential Profile ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Junction Diode

Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy

2000 ◽  
Vol 77 (1) ◽  
pp. 106-108 ◽  
Author(s):  
G. H. Buh ◽  
H. J. Chung ◽  
C. K. Kim ◽  
J. H. Yi ◽  
I. T. Yoon ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Applied Bias ◽  
Kelvin Probe ◽  
Scanning Capacitance Microscopy ◽  
Force Microscopy ◽  
Pn Junction

Cross-sectional potential profile across a BaSi2pn junction by Kelvin probe force microscopy

2015 ◽  
Vol 54 (3) ◽  
pp. 030306 ◽  
Author(s):  
Daichi Tsukahara ◽  
Masakazu Baba ◽  
Kentaro Watanabe ◽  
Takashi Kimura ◽  
Kosuke O. Hara ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Potential Profile ◽  
Kelvin Probe ◽  
Cross Sectional ◽  
Force Microscopy
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