Resolution enhancement by image fusion for microgrid polarization imagers

Image fusion, a popular method for resolution enhancement in Earth-based remote sensing studies involves the integration of geometric (sharpness) detail of a high-resolution panchromatic (Pan) image and the spectral information of a lower resolution multi-spectral (MS) image. Image fusion with planetary images is not as widespread as with terrestrial studies, although successful application of image fusion can lead to the generation of higher resolution MS image data. A comprehensive comparison of six image fusion algorithms in the context of lunar images is presented in this work. Performance of these algorithms is compared by visual inspection of the high-resolution multi-spectral products, derived products such as band-to-band ratio and composite images, and performance metrics with an emphasis on spectral content preservation. Enhanced MS images of the lunar surface can enable new science and maximize the science return for current and future missions.

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ENHANCEMENT OF SPATIAL RESOLUTION OF THE LROC WIDE ANGLE CAMERA IMAGES

ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences ◽

10.5194/isprsarchives-xli-b7-685-2016 ◽

2016 ◽

Vol XLI-B7 ◽

pp. 685-692

Author(s):

P. Mahanti ◽

M. S. Robinson ◽

H. Sato ◽

A. Awumah ◽

M. Henriksen

Keyword(s):

High Resolution ◽

Image Fusion ◽

Work Performance ◽

Performance Metrics ◽

Resolution Enhancement ◽

Image Data ◽

Band Ratio ◽

New Science ◽

And Performance ◽

Wide Angle Camera

Image fusion, a popular method for resolution enhancement in Earth-based remote sensing studies involves the integration of geometric (sharpness) detail of a high-resolution panchromatic (Pan) image and the spectral information of a lower resolution multi-spectral (MS) image. Image fusion with planetary images is not as widespread as with terrestrial studies, although successful application of image fusion can lead to the generation of higher resolution MS image data. A comprehensive comparison of six image fusion algorithms in the context of lunar images is presented in this work. Performance of these algorithms is compared by visual inspection of the high-resolution multi-spectral products, derived products such as band-to-band ratio and composite images, and performance metrics with an emphasis on spectral content preservation. Enhanced MS images of the lunar surface can enable new science and maximize the science return for current and future missions.

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Off-axis electron holography applied to the study of interfaces

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100121624 ◽

1992 ◽

Vol 50 (1) ◽

pp. 244-245

Author(s):

J.K. Weiss ◽

M. Gajdardziska-Josifovska ◽

M. R. McCartney ◽

David J. Smith

Keyword(s):

Electric Fields ◽

Resolution Enhancement ◽

Interfacial Structure ◽

Atomic Scale ◽

Bulk Property ◽

Electron Holography ◽

Specimen Thickness ◽

Composition And Structure ◽

Chemical Segregation ◽

Diffraction Effects

Interfacial structure is a controlling parameter in the behavior of many materials. Electron microscopy methods are widely used for characterizing such features as interface abruptness and chemical segregation at interfaces. The problem for high resolution microscopy is to establish optimum imaging conditions for extracting this information. We have found that off-axis electron holography can provide useful information for the study of interfaces that is not easily obtained by other techniques.Electron holography permits the recovery of both the amplitude and the phase of the image wave. Recent studies have applied the information obtained from electron holograms to characterizing magnetic and electric fields in materials and also to atomic-scale resolution enhancement. The phase of an electron wave passing through a specimen is shifted by an amount which is proportional to the product of the specimen thickness and the projected electrostatic potential (ignoring magnetic fields and diffraction effects). If atomic-scale variations are ignored, the potential in the specimen is described by the mean inner potential, a bulk property sensitive to both composition and structure. For the study of interfaces, the specimen thickness is assumed to be approximately constant across the interface, so that the phase of the image wave will give a picture of mean inner potential across the interface.

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