High-speed vertical positioning for contact-mode atomic force microscopy

2009 ◽  
Author(s):  
Andrew J. Fleming
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Vertical Positioning ◽  
Mode Atomic Force Microscopy

Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy

2012 ◽  
Vol 83 (8) ◽  
pp. 083710 ◽  
Author(s):  
O. D. Payton ◽  
L. Picco ◽  
M. J. Miles ◽  
M. E. Homer ◽  
A. R. Champneys
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Signal To Noise Ratio ◽  
Signal To Noise ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Noise Ratio ◽  
Mode Atomic Force Microscopy

scholarly journals ‘Hi-Fi AFM’: high-speed contact mode atomic force microscopy with optical pickups

2018 ◽  
Vol 29 (10) ◽  
pp. 105902 ◽  
Author(s):  
F S Russell-Pavier ◽  
L Picco ◽  
J C C Day ◽  
N R Shatil ◽  
A Yacoot ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

scholarly journals Contact-Mode High-Resolution High-Speed Atomic Force Microscopy Movies of the Purple Membrane

2009 ◽  
Vol 97 (5) ◽  
pp. 1354-1361 ◽  
Author(s):  
Ignacio Casuso ◽  
Noriyuki Kodera ◽  
Christian Le Grimellec ◽  
Toshio Ando ◽  
Simon Scheuring
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
High Speed ◽  
Purple Membrane ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach

2017 ◽  
Vol 8 ◽  
pp. 1563-1570 ◽  
Author(s):  
Juan Ren ◽  
Qingze Zou
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Interaction Force ◽  
Dynamic Mode ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Mode Tm ◽  
Mode Atomic Force Microscopy

Adaptive multiloop-mode (AMLM) imaging to substantially increase (over an order of magnitude) the speed of tapping-mode (TM) imaging is tested and evaluated through imaging three largely different heterogeneous polymer samples in experiments. It has been demonstrated that AMLM imaging, through the combination of a suite of advanced control techniques, is promising to achieve high-speed dynamic-mode atomic force microscopy imaging. The performance, usability, and robustness of the AMLM in various imaging applications, however, is yet to be assessed. In this work, three benchmark polymer samples, including a PS–LDPE sample, an SBS sample, and a Celgard sample, differing in feature size and stiffness of two orders of magnitude, are imaged using the AMLM technique at high-speeds of 25 Hz and 20 Hz, respectively. The comparison of the images obtained to those obtained by using TM imaging at scan rates of 1 Hz and 2 Hz showed that the quality of the 25 Hz and 20 Hz AMLM imaging is at the same level of that of the 1 Hz TM imaging, while the tip–sample interaction force is substantially smaller than that of the 2 Hz TM imaging.

Vibrational Response of FeNi3Nanoparticles to the Flux of a Modulated Electromagnetic Field Detected by Contact-Mode Atomic Force Microscopy

2013 ◽  
Vol 117 (36) ◽  
pp. 18768-18776 ◽  
Author(s):  
Algernon T. Kelley ◽  
Wilson K. Serem ◽  
Stephanie L. Daniels ◽  
Lauren E. Englade-Franklin ◽  
Gregory Morrison ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electromagnetic Field ◽  
Contact Mode ◽  
Force Microscopy ◽  
Vibrational Response ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy
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