This work presents the results from the characterization of a Position-Sensitive Planar Germanium (PSPGe) detector. The PSPGe detector is a double-sided orthogonal strip detector consisting of 10x10 electrical segmentation along the horizontal and vertical directions. The characterization was performed using the coincidence setup between the PSPGe detector and the well-characterized scanning system employing the positron annihilation correlation principle. The scanning system consists of a Position Sensitive Detector (PSD) and 22Na positron source. The main objective of this study is to deploy PSPGe detector for future decay experiments at the Facility for Antiproton and Ion Research (FAIR), Germany. The measurements have been performed to find the depth of gamma-ray interaction in the planar segmented detector. The 2-Dimensional image obtained from the PSD has been used to find the depth of gamma-ray interaction in the planar strip detector using pulse shape analysis. In addition, the sensitivity of PSPGe detector has been investigated by calculating the rise-time from pulse shapes for the front and back strips of the detector.
Characterization of a triple‐GEM position sensitive detector for X‐ray fluorescence imaging
