Residual errors determination for vector network analyzer at a low resolution in the time domain

Author(s):  
Aleksandr A. Savin ◽  
Vladimir G. Guba ◽  
Benjamin D. Maxson
1992 ◽  
Vol 2 (8) ◽  
pp. 319-321 ◽  
Author(s):  
R.Y. Yu ◽  
J. Pusl ◽  
Y. Konishi ◽  
M. Case ◽  
M. Kamegawa ◽  
...  

2013 ◽  
Vol 333-335 ◽  
pp. 254-258 ◽  
Author(s):  
Hui Huang ◽  
Xin Meng Liu ◽  
Xin Lv

This paper presents a method improving accuracy for evaluating S-parameters (Scattering-parameters) of MCP (Microwave Coplanar Probe). This method may be named one-port two-tier Multi-TRL (Thru-Reflect-Line) calibration method. It measures two-port devices only at one port of VNA (Vector Network Analyzer). It decreases the random errors caused of cable movements and connecting times. This method is implemented with coaxial OSL (Open-Short-Load) and on-wafer TRL calibration kit. It directly calculates and removes the residual errors caused of coaxial OSL calibration kit imperfection. It significantly reduced system errors by using on-wafer TRL calibration kit. To verify the effectiveness of the proposed method, the measured S-parameters up to 50GHz of MCP configured with GSG-100 are given and discussed.


2018 ◽  
Vol 83 (3) ◽  
pp. 30601 ◽  
Author(s):  
Abelin Kameni ◽  
Florent Loete ◽  
Lionel Pichon

This paper presents experimental and numerical studies of a chafing soft defect realized by partially milling coaxial cables. The approach is based on the time domain reflectometry technique. The numerical model consists in solving Maxwell’s equations while an incident Gaussian pulse is injected on the faulty line. The experimental time domain measurements are performed with a vector network analyzer. To get the experimental results comparable to the numerical ones, a process to denoise the measured impulse responses is proposed. The reflection coefficients obtained are compared to those given by a classical approach based on a chain matrix model to show the impact of 3D numerical modeling in studying soft faults.


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