Maximal multiple fault coverage using single fault test sets

Proceedings of Eighth International Application Specific Integrated Circuits Conference ◽

10.1109/asic.1995.580720 ◽

2002 ◽

Author(s):

A.-F. Yousif ◽

J. Gu

Keyword(s):

Fault Coverage ◽

Multiple Fault ◽

Single Fault ◽

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Synthesis of multiple fault oriented test groups from single fault test sets

2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2013.6527786 ◽

2013 ◽

Author(s):

Raimund Ubar ◽

S. Kostin ◽

J. Raik

Keyword(s):

Multiple Fault ◽

Single Fault ◽

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MULTIPLE-FAULT SIMULATION AND COVERAGE OF DETERMINISTIC SINGLE-FAULT TEST SETS

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519761 ◽

2005 ◽

Author(s):

K. Kubiak ◽

W.K. Fuchs

Keyword(s):

Fault Simulation ◽

Multiple Fault ◽

Single Fault ◽

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Multiple Fault Testing of Large Circuits by Single Fault Test Sets

IEEE Transactions on Computers ◽

10.1109/tc.1981.1675716 ◽

1981 ◽

Vol C-30 (11) ◽

pp. 855-865 ◽

Author(s):

Agarwal ◽

Fung

Keyword(s):

Fault Testing ◽

Multiple Fault ◽

Single Fault ◽

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Multiple fault testing of large circuits by single fault test sets

IEEE Transactions on Circuits and Systems ◽

10.1109/tcs.1981.1084929 ◽

1981 ◽

Vol 28 (11) ◽

pp. 1059-1069 ◽

Author(s):

V. Agarwal ◽

A. Fung

Keyword(s):

Fault Testing ◽

Multiple Fault ◽

Single Fault ◽

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Enhancing the multiple-fault detection of single-fault test sets

Computer-Aided Design ◽

10.1016/0010-4485(92)90077-n ◽

1992 ◽

Vol 24 (5) ◽

pp. 243-250

Author(s):

T.-Y. Kuo ◽

J.-F. Wang ◽

J.-Y. Lee

Keyword(s):

Fault Detection ◽

Multiple Fault ◽

Single Fault ◽

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Multiple fault detection using single fault test sets

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.3137 ◽

1988 ◽

Vol 7 (1) ◽

pp. 100-108 ◽

Author(s):

J.L.A. Hughes

Keyword(s):

Fault Detection ◽

Multiple Fault ◽

Single Fault ◽

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Single fault equivalence classes and minimal test sets in combinational networks

Microelectronics Reliability ◽

10.1016/0026-2714(80)90674-5 ◽

1980 ◽

Vol 20 (4) ◽

pp. 544

Keyword(s):

Equivalence Classes ◽

Single Fault ◽

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A new measure for calculating multiple fault coverage of microprocessor self-test

2016 15th Biennial Baltic Electronics Conference (BEC) ◽

10.1109/bec.2016.7743732 ◽

2016 ◽

Author(s):

Adeboye Stephen Oyeniran ◽

Uzochukwu Eddie Odozi ◽

Raimund Ubar

Keyword(s):

Fault Coverage ◽

Multiple Fault ◽

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Single fault equivalence classes and minimal test sets in combinational networks

International Journal of Electronics ◽

10.1080/00207217908938646 ◽

1979 ◽

Vol 47 (3) ◽

pp. 297-310

Author(s):

JAYASREE DUTTAGUPTA ◽

PRADIP K. SRIMANI

Keyword(s):

Equivalence Classes ◽

Single Fault ◽

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Hybrid delay scan: a low hardware overhead scan-based delay test technique for high fault coverage and compact test sets

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1269074 ◽

2004 ◽

Author(s):

Seongmoon Wang ◽

Xiao Liu ◽

S.T. Chakradhar

Keyword(s):

Fault Coverage ◽

Test Technique ◽

Hardware Overhead ◽

Test Sets ◽

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