2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
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Published By IEEE

9781467360401, 9781467360395, 9781467360388

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures

2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2013.6527775 ◽

2013 ◽

Cited By ~ 4

Author(s):

E. I. Vatajelu ◽

A. Bosio ◽

L. Dilillo ◽

P. Girard ◽

A. Todri ◽

...

Keyword(s):

The Core ◽

Sense Amplifiers

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Energy efficient system-on-chip architecture for non-invasive mobile monitoring of diabetics

2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2013.6527805 ◽

2013 ◽

Cited By ~ 7

Author(s):

Mohammad Alhawari ◽

Ahsan Khandoker ◽

Baker Mohammad ◽

Hani Saleh ◽

Kinda Khalaf ◽

...

Keyword(s):

Energy Efficient ◽

System On Chip ◽

Mobile Monitoring ◽

Efficient System ◽

Non Invasive ◽

On Chip

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Preliminary all digital Channel Filter design for LTE-Advanced software radio implementation

2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2013.6527802 ◽

2013 ◽

Author(s):

M. Hallal ◽

B. Swaked ◽

L. Albasha

Keyword(s):

Filter Design ◽

Software Radio ◽

Lte Advanced ◽

Channel Filter

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A high-throughput, contention-free low-power, Radix-2 1k,2k, 4k and 8k-point fast fourier transform engine using 28nm standard-cell process

2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2013.6527807 ◽

2013 ◽

Author(s):

H. H. Saleh ◽

B. S. Mohammad ◽

M. Maalouf

Keyword(s):

Fourier Transform ◽

Low Power ◽

Fast Fourier Transform ◽

High Throughput ◽

Cell Process ◽

Standard Cell ◽

Point Fast Fourier Transform

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Synthesis of multiple fault oriented test groups from single fault test sets

2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2013.6527786 ◽

2013 ◽

Author(s):

Raimund Ubar ◽

S. Kostin ◽

J. Raik

Keyword(s):

Multiple Fault ◽

Single Fault ◽

Test Sets

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Multi-CNTFETs for power device applications: Investigation of CCVD grown CNTs by means of atomic force microscopy

2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2013.6527767 ◽

2013 ◽

Cited By ~ 2

Author(s):

Martin Keyn ◽

U. Schwalke

Keyword(s):

Atomic Force Microscopy ◽

Power Device ◽

Force Microscopy ◽

Atomic Force ◽

Device Applications

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Privilege escalation attack through address space identifier corruption in untrusted modern processors

2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2013.6527798 ◽

2013 ◽

Cited By ~ 1

Author(s):

M. Maniatakos

Keyword(s):

Address Space

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Robust polysilicon gate FinFET SRAM design using dynamic back-gate bias

2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2013.6527801 ◽

2013 ◽

Cited By ~ 1

Author(s):

B. Ebrahimi ◽

Ali Afzali-Kusha ◽

N. Sehatbakhsh

Keyword(s):

Gate Bias ◽

Back Gate ◽

Polysilicon Gate ◽

Sram Design

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Reconfigurable low noise amplifier using MEMS varactor

2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2013.6527795 ◽

2013 ◽

Author(s):

N. Emami ◽

O. Arshed ◽

M. Bakri-Kassem ◽

L. Albasha

Keyword(s):

Low Noise ◽

Low Noise Amplifier ◽

Noise Amplifier

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Monitoring operating temperature and supply voltage in achieving high system dependability

2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2013.6527788 ◽

2013 ◽

Cited By ~ 1

Author(s):

M. A. Khan ◽

H. G. Kerkhoff

Keyword(s):

Supply Voltage ◽

Operating Temperature ◽

High System

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2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures

Energy efficient system-on-chip architecture for non-invasive mobile monitoring of diabetics

Preliminary all digital Channel Filter design for LTE-Advanced software radio implementation

A high-throughput, contention-free low-power, Radix-2 1k,2k, 4k and 8k-point fast fourier transform engine using 28nm standard-cell process

Synthesis of multiple fault oriented test groups from single fault test sets

Multi-CNTFETs for power device applications: Investigation of CCVD grown CNTs by means of atomic force microscopy

Privilege escalation attack through address space identifier corruption in untrusted modern processors

Robust polysilicon gate FinFET SRAM design using dynamic back-gate bias

Reconfigurable low noise amplifier using MEMS varactor

Monitoring operating temperature and supply voltage in achieving high system dependability

2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
Latest Publications