scholarly journals Mask Classification and Head Temperature Detection Combined with Deep Learning Networks

Author(s):  
Isack Farady ◽  
Chih-Yang Lin ◽  
Amornthep Rojanasarit ◽  
Kanatip Prompol ◽  
Fityanul Akhyar
2021 ◽  
Vol 11 (1) ◽  
pp. 339-348
Author(s):  
Piotr Bojarczak ◽  
Piotr Lesiak

Abstract The article uses images from Unmanned Aerial Vehicles (UAVs) for rail diagnostics. The main advantage of such a solution compared to traditional surveys performed with measuring vehicles is the elimination of decreased train traffic. The authors, in the study, limited themselves to the diagnosis of hazardous split defects in rails. An algorithm has been proposed to detect them with an efficiency rate of about 81% for defects not less than 6.9% of the rail head width. It uses the FCN-8 deep-learning network, implemented in the Tensorflow environment, to extract the rail head by image segmentation. Using this type of network for segmentation increases the resistance of the algorithm to changes in the recorded rail image brightness. This is of fundamental importance in the case of variable conditions for image recording by UAVs. The detection of these defects in the rail head is performed using an algorithm in the Python language and the OpenCV library. To locate the defect, it uses the contour of a separate rail head together with a rectangle circumscribed around it. The use of UAVs together with artificial intelligence to detect split defects is an important element of novelty presented in this work.


Sensors ◽  
2021 ◽  
Vol 21 (4) ◽  
pp. 1031
Author(s):  
Joseba Gorospe ◽  
Rubén Mulero ◽  
Olatz Arbelaitz ◽  
Javier Muguerza ◽  
Miguel Ángel Antón

Deep learning techniques are being increasingly used in the scientific community as a consequence of the high computational capacity of current systems and the increase in the amount of data available as a result of the digitalisation of society in general and the industrial world in particular. In addition, the immersion of the field of edge computing, which focuses on integrating artificial intelligence as close as possible to the client, makes it possible to implement systems that act in real time without the need to transfer all of the data to centralised servers. The combination of these two concepts can lead to systems with the capacity to make correct decisions and act based on them immediately and in situ. Despite this, the low capacity of embedded systems greatly hinders this integration, so the possibility of being able to integrate them into a wide range of micro-controllers can be a great advantage. This paper contributes with the generation of an environment based on Mbed OS and TensorFlow Lite to be embedded in any general purpose embedded system, allowing the introduction of deep learning architectures. The experiments herein prove that the proposed system is competitive if compared to other commercial systems.


Author(s):  
Lu Gao ◽  
Yao Yu ◽  
Yi Hao Ren ◽  
Pan Lu

Pavement maintenance and rehabilitation (M&R) records are important as they provide documentation that M&R treatment is being performed and completed appropriately. Moreover, the development of pavement performance models relies heavily on the quality of the condition data collected and on the M&R records. However, the history of pavement M&R activities is often missing or unavailable to highway agencies for many reasons. Without accurate M&R records, it is difficult to determine if a condition change between two consecutive inspections is the result of M&R intervention, deterioration, or measurement errors. In this paper, we employed deep-learning networks of a convolutional neural network (CNN) model, a long short-term memory (LSTM) model, and a CNN-LSTM combination model to automatically detect if an M&R treatment was applied to a pavement section during a given time period. Unlike conventional analysis methods so far followed, deep-learning techniques do not require any feature extraction. The maximum accuracy obtained for test data is 87.5% using CNN-LSTM.


2020 ◽  
Vol 2020 ◽  
pp. 1-11
Author(s):  
Yuanyuan Xu ◽  
Genke Yang ◽  
Jiliang Luo ◽  
Jianan He

Electronic component recognition plays an important role in industrial production, electronic manufacturing, and testing. In order to address the problem of the low recognition recall and accuracy of traditional image recognition technologies (such as principal component analysis (PCA) and support vector machine (SVM)), this paper selects multiple deep learning networks for testing and optimizes the SqueezeNet network. The paper then presents an electronic component recognition algorithm based on the Faster SqueezeNet network. This structure can reduce the size of network parameters and computational complexity without deteriorating the performance of the network. The results show that the proposed algorithm performs well, where the Receiver Operating Characteristic Curve (ROC) and Area Under the Curve (AUC), capacitor and inductor, reach 1.0. When the FPR is less than or equal 10 − 6   level, the TPR is greater than or equal to 0.99; its reasoning time is about 2.67 ms, achieving the industrial application level in terms of time consumption and performance.


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