scholarly journals Visual Anomaly Detection in Event Sequence Data

Author(s):  
Shunan Guo ◽  
Zhuochen Jin ◽  
Qing Chen ◽  
David Gotz ◽  
Hongyuan Zha ◽  
...  
2015 ◽  
Vol 2015 ◽  
pp. 1-13
Author(s):  
Jianwei Ding ◽  
Yingbo Liu ◽  
Li Zhang ◽  
Jianmin Wang

Condition monitoring systems are widely used to monitor the working condition of equipment, generating a vast amount and variety of telemetry data in the process. The main task of surveillance focuses on analyzing these routinely collected telemetry data to help analyze the working condition in the equipment. However, with the rapid increase in the volume of telemetry data, it is a nontrivial task to analyze all the telemetry data to understand the working condition of the equipment without any a priori knowledge. In this paper, we proposed a probabilistic generative model called working condition model (WCM), which is capable of simulating the process of event sequence data generated and depicting the working condition of equipment at runtime. With the help of WCM, we are able to analyze how the event sequence data behave in different working modes and meanwhile to detect the working mode of an event sequence (working condition diagnosis). Furthermore, we have applied WCM to illustrative applications like automated detection of an anomalous event sequence for the runtime of equipment. Our experimental results on the real data sets demonstrate the effectiveness of the model.


Author(s):  
Asma Belhadi ◽  
Youcef Djenouri ◽  
Gautam Srivastava ◽  
Alberto Cano ◽  
Jerry Chun-Wei Lin

2018 ◽  
Vol 24 (1) ◽  
pp. 56-65 ◽  
Author(s):  
Shunan Guo ◽  
Ke Xu ◽  
Rongwen Zhao ◽  
David Gotz ◽  
Hongyuan Zha ◽  
...  

2021 ◽  
pp. 47-61
Author(s):  
Johannes De Smedt ◽  
Anton Yeshchenko ◽  
Artem Polyvyanyy ◽  
Jochen De Weerdt ◽  
Jan Mendling

Author(s):  
Zhuochen Jin ◽  
Shunan Guo ◽  
Nan Chen ◽  
Daniel Weiskopf ◽  
David Gotz ◽  
...  

2019 ◽  
Vol 179 ◽  
pp. 136-144 ◽  
Author(s):  
Ken-ichi Fukui ◽  
Yoshiyuki Okada ◽  
Kazuki Satoh ◽  
Masayuki Numao

Sensors ◽  
2020 ◽  
Vol 20 (20) ◽  
pp. 5766
Author(s):  
Xinmiao Sun ◽  
Ruiqi Li ◽  
Zhen Yuan

Anomaly detection for discrete manufacturing systems is important in intelligent manufacturing. In this paper, we address the problem of anomaly detection for the discrete manufacturing systems with complicated processes, including parallel processes, loop processes, and/or parallel with nested loop sub-processes. Such systems can generate a series of discrete event data during normal operations. Existing methods that deal with the discrete sequence data may not be efficient for the discrete manufacturing systems or methods that are dealing with manufacturing systems only focus on some specific systems. In this paper, we take the middle way and seek to propose an efficient algorithm by applying only the system structure information. Motivated by the system structure information that the loop processes may result in repeated events, we propose two algorithms—centralized pattern relation table algorithm and parallel pattern relation table algorithm—to build one or multiple relation tables between loop pattern elements and individual events. The effectiveness of the proposed algorithms is tested by two artificial data sets that are generated by Timed Petri Nets. The experimental results show that the proposed algorithms can achieve higher AUC and F1-score, even with smaller sized data set compared to the other algorithms and that the parallel algorithm achieves the highest performance with the smallest data set.


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