Determination of refractive index profile of the planar waveguide by wedge technique and chemical sample preparation

Author(s):  
S.M.R. Sadat Hosseini ◽  
A. Darudi ◽  
M.T. Tavassoly ◽  
N. Granpayeh ◽  
A. Goodarzi
2001 ◽  
Vol 10 (02) ◽  
pp. 169-179
Author(s):  
HENRI P. URANUS ◽  
M. O. TJIA

A method is proposed for the reconstruction of refractive index profile of planar waveguide from its fundamental mode intensity profile. The reconstruction is performed by fitting the calculated intensity distribution iteratively with the measured intensity distribution employing nonlinear least-squares regression technique. At each stage of iteration, new trial parameter values are generated and used to form a waveguide model approximated by a multilayer structure with stepwise index distribution, upon which the intensity distribution is then calculated by using the characteristic matrix technique. This method was numerically examined by using samples of either known or unknown analytic expression of the index profile.


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