Photoluminescence properties of thin-film SiOxCy deposited by O-Cat CVD technique using MMS and TEOS

Author(s):  
Manmohan Jain ◽  
J. R. Ramos-Serrano ◽  
Ateet Dutt ◽  
Yasuhiro Matsumoto
AIP Advances ◽  
2019 ◽  
Vol 9 (8) ◽  
pp. 085324 ◽  
Author(s):  
Thomas Mann ◽  
Billy Richards ◽  
Eric Kumi-Barimah ◽  
Robert Mathieson ◽  
Matthew Murray ◽  
...  

2010 ◽  
Vol 638-642 ◽  
pp. 2909-2914 ◽  
Author(s):  
Yuichi Sato ◽  
Tatsushi Kodate ◽  
Manabu Arai

Thin films of CdTe semiconductors were prepared on sapphire single crystal and quartz glass substrates by a vacuum evaporation method. Crystallinity and photoluminescence properties of the obtained CdTe thin films on the substrates were semi-quantitatively compared concerning the difference of the substrate materials. Dependences of the properties on the substrate temperature in the preparations and indium doping to the thin films were also investigated.


2004 ◽  
Vol 151 (8) ◽  
pp. H184 ◽  
Author(s):  
Sung-Ho Choi ◽  
Chong-Ook Park ◽  
Hyung-Sang Park ◽  
Sang-Hee Ko Park ◽  
Sun Jin Yun

2018 ◽  
Vol 150 ◽  
pp. 252-260 ◽  
Author(s):  
Denis S. Baranov ◽  
Mikhail N. Uvarov ◽  
Evgeni M. Glebov ◽  
Danil A. Nevostruev ◽  
Maxim S. Kazantsev ◽  
...  

2009 ◽  
Vol 12 (8) ◽  
pp. E20 ◽  
Author(s):  
L. Wang ◽  
H. Jia ◽  
X. Yu ◽  
Y. Zhang ◽  
P. Du ◽  
...  

1999 ◽  
Vol 558 ◽  
Author(s):  
K.G. Cho ◽  
D. Kumar ◽  
Z. Chen ◽  
P. H. Holloway ◽  
R. K. Singh

ABSTRACTEuropium-activated yttrium oxide (Eu:Y2O3) thin films were deposited on (100) silicon and (0001) sapphire substrates using 248 nm KrF pulsed laser. To investigate the effect of the Eu:Y2O3 film roughness on cathodoluminescence (CL) and photoluminescence (PL) properties, the substrate surfaces with various roughnesses were used. The roughness was found to play an important role in determining CL and PL brightness of the Eu:Y2O3 films. The improvement in brightness by increasing the film roughness is due to increase in total portion of light that escapes from the surface of the phosphor film. A model has been proposed which supports strongly this explanation. Our results show that depositions with slower growth rate and lower laser energy are more important parameters than increasing the roughness to improve CL brightness of the Eu:Y2O3 thin film phosphors.


2011 ◽  
Vol 520 (1) ◽  
pp. 174-178 ◽  
Author(s):  
L. Wang ◽  
N. Liao ◽  
H. Zeng ◽  
L. Shi ◽  
H. Jia ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document