A Multiple Faults Test Generation Algorithm Based on Neural Networks and Chaotic Searching for Digital Circuits
Keyword(s):
2016 ◽
Vol 9
(6)
◽
pp. 377-388
Keyword(s):
1987 ◽
Vol 134
(2)
◽
pp. 69
◽
Keyword(s):
2005 ◽
Vol 128
(4)
◽
pp. 773-782
◽
Keyword(s):