A high-speed serial transport platform based on SRIO for high-resolution image

2010 ◽  
Author(s):  
Feng Zhang ◽  
Qinzhang Wu ◽  
Guoqiang Ren
Keyword(s):  
High Resolution ◽  
High Speed ◽  
Resolution Image ◽  
High Resolution Image

High-Speed Acquisition and Processing Method for High Resolution Image of Wheel Set

2010 ◽  
Vol 44-47 ◽  
pp. 3859-3863
Author(s):  
Kai Hua Wu ◽  
Jian Xin Fan
Keyword(s):  
High Resolution ◽  
Digital Signal Processor ◽  
High Speed ◽  
Data Exchange ◽  
Digital Signal ◽  
Pulse Generation ◽  
Processing Method ◽  
Operational Mode ◽  
Resolution Image ◽  
High Resolution Image

Measurement of wheel set wear was an important step for the safety of train running. High-speed acquisition and processing method for high resolution image of wheel set based on the hardware platform of DSP (digital signal processor) and PC was proposed. High-speed acquisition and processing was completed by PC and DSP unit separately. PC and DSP unit worked in parallel operational mode. Ethernet transport program based on TCP was designed for data exchange. Asynchronous reset pulse generation circuits were designed. High resolution images of wheel set were captured in 500fps and asynchronous reset mode. Resolution of images was 1280*1024. The experimental results showed that this method improved image processing speed effectively.

High-Speed Satellite Detection in High-Resolution Image Using Image Processing

2018 ◽  
Vol 46 (5) ◽  
pp. 427-435
Author(s):  
Seunghyeok Shin ◽  
Jongmin Lee ◽  
Sangwook Lee ◽  
Taeseok Yang ◽  
Whoi-Yul Kim
Keyword(s):  
Image Processing ◽  
High Resolution ◽  
High Speed ◽  
Resolution Image ◽  
High Resolution Image

Radiation Damage, Contrast and Statistics in High Resolution Biological Electron Microscopy

1970 ◽  
Vol 28 ◽  
pp. 260-261
Author(s):  
Robert M. Glaeser
Keyword(s):  
High Resolution ◽  
Particle Flux ◽  
Unit Area ◽  
Signal To Noise ◽  
Resolution Image ◽  
High Resolution Image ◽  
Pass Through ◽  
Counting Statistics ◽  
The Relationship ◽  
Picture Element

It is well known that a large flux of electrons must pass through a specimen in order to obtain a high resolution image while a smaller particle flux is satisfactory for a low resolution image. The minimum particle flux that is required depends upon the contrast in the image and the signal-to-noise (S/N) ratio at which the data are considered acceptable. For a given S/N associated with statistical fluxtuations, the relationship between contrast and “counting statistics” is s131_eqn1, where C = contrast; r2 is the area of a picture element corresponding to the resolution, r; N is the number of electrons incident per unit area of the specimen; f is the fraction of electrons that contribute to formation of the image, relative to the total number of electrons incident upon the object.

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