Engineering implication of the correlation between the leakage current in high-k dielectric materials and the electronic defect states detected by zero-bias thermally stimulated current spectroscopy
Keyword(s):
2012 ◽
Vol 159
(5)
◽
pp. G67-G73
◽
Keyword(s):
1996 ◽
Vol 35
(Part 1, No. 5A)
◽
pp. 2599-2604
◽
1995 ◽