GPS Based Bistatic Radar – Beyond Specular Reflection

2006 ◽  
Author(s):  
M. de Vries
Keyword(s):  
Specular Reflection ◽  
Bistatic Radar

scholarly journals Analysis of RCS of Low Observable Aircraft in VHF Band

2018 ◽  
Vol 2018 ◽  
pp. 1-10 ◽  
Author(s):  
Yi-Ru Jeong ◽  
Chan-Sun Park ◽  
Young-Kwan Ko ◽  
Jong-Gwan Yook
Keyword(s):  
Method Of Moments ◽  
Cross Sections ◽  
Incident Wave ◽  
Specular Reflection ◽  
Three Dimensional ◽  
Bistatic Radar ◽  
Three Dimensional Model ◽  
Maximum Value ◽  
Radar Cross Sections ◽  
Fast Multipole Algorithm

Electromagnetic signatures of a low observable aircraft have been studied in VHF band. First of all, a three-dimensional model of the aircraft has been established for numerical computation. Then, monostatic and bistatic radar cross sections (RCS) have been calculated. The model of the aircraft is made by a curved surface, and commercial as well as in-house three-dimensional electromagnetic code which is based on the method of moments (MoM) is utilized to calculate the RCS. A characteristic basis function method (CBFM) and a multilevel fast multipole algorithm (MLFMA) have been applied to analyze electrically large objects. The change of the monostatic RCS is very large depending on the direction of the incident wave. The maximum value is about 42 dBsm at the top and bottom of the aircraft, and the minimum value is about −10 dBsm at the front and back of the aircraft. It is found that the bistatic RCS also changes dramatically depending on the direction of the incident wave. The direction of maximum RCS occurs around specular reflection, and the value of maximum RCS ranges from 27 dBsm to 43 dBsm. On the other hand, the direction of the minimum RCS occurs irregularly, and the value is in the level of −30 dBsm.

Forensic applications of IR infrared microscopic internal reflection spectroscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1528-1529
Author(s):  
Edward G. Bartick ◽  
John A. Reffner
Keyword(s):  
Specular Reflection ◽  
Forensic Analysis ◽  
Attenuated Total Reflection ◽  
Internal Reflection ◽  
Standard Size ◽  
Ir Microscopy ◽  
Ir Analysis ◽  
Plastic Explosives ◽  
Internal Reflection Spectroscopy ◽  
Reflectance Measurements

Since the introduction of commercial Fourier transform infrared (FTIR) microscopic systems in 1983, IR microscopy has developed as an important analytical tool in research, industry and forensic analysis. Because of the frequent encounter of small quantities of physical evidence found at crime scenes, spectroscopic IR microscopes have proven particularly valuable for forensic applications. Transmittance and reflectance measurements have proven very useful. Reflection-absorption, specular reflection, and diffuse reflection have all been applied. However, it has been only very recently that an internal reflection (IRS) objective has been commercially introduced.The IRS method, also known as attenuated total reflection (ATR), has proven very useful for IR analysis of standard size samples. The method has been applied to adhesive tapes, plastic explosives, and general applications in the analysis of opaque materials found as evidence. The small quantities or uncontaminated areas of specimens frequently found requiring forensic analysis will often be directly applicable to microscopic IRS analysis.

Valence electron energy loss spectroscopy in reflection geometry

1989 ◽  
Vol 47 ◽  
pp. 378-379
Author(s):  
J. Liu ◽  
J. M. Cowley
Keyword(s):  
Energy Loss ◽  
Valence Electron ◽  
Interband Transition ◽  
Specular Reflection ◽  
Three Dimensional ◽  
Electron Excitation ◽  
Transmission Electron ◽  
Yield Information ◽  
Valence Bands ◽  
Excitation Processes

The low energy loss region of a EELS spectrum carries information about the valence electron excitation processes (e.g., collective excitations for free electron like materials and interband transitions for insulators). The relative intensities and the positions of the interband transition energy loss peaks observed in EELS spectra are determined by the joint density of states (DOS) of the initial and final states of the excitation processes. Thus it is expected that EELS in reflection mode could yield information about the perturbation of the DOS of the conduction and valence bands of the bulk crystals caused by the termination of the three dimensional periodicity at the crystal surfaces. The experiments were performed in a Philipps 400T transmission electron microscope operated at 120 kV. The reflection EELS spectra were obtained by a Gatan 607 EELS spectrometer together with a Tracor data acquisition system and the resolution of the spectrometer was about 0.8 eV. All the reflection spectra are obtained from the specular reflection spots satisfying surface resonance conditions.

scholarly journals Specular Reflection Image Enhancement Based on a Dark Channel Prior

2021 ◽  
Vol 13 (1) ◽  
pp. 1-11
Author(s):  
Ye Xin ◽  
Zhenhong Jia ◽  
Jie Yang ◽  
Nikola K. Kasabov
Keyword(s):  
Image Enhancement ◽  
Specular Reflection ◽  
Dark Channel Prior ◽  
Dark Channel ◽  
Reflection Image

Real-time Approximation of Photometric Polygonal Lights

2020 ◽  
Vol 3 (1) ◽  
pp. 1-18
Author(s):  
Christian Luksch ◽  
Lukas Prost ◽  
Michael Wimmer
Keyword(s):  
Real Time ◽  
Specular Reflection ◽  
Near Field ◽  
Measurement Data ◽  
Data Sets ◽  
Photometric Measurement ◽  
Integration Technique ◽  
Time Approximation ◽  
Light Emitter ◽  
Selection Of

We present a real-time rendering technique for photometric polygonal lights. Our method uses a numerical integration technique based on a triangulation to calculate noise-free diffuse shading. We include a dynamic point in the triangulation that provides a continuous near-field illumination resembling the shape of the light emitter and its characteristics. We evaluate the accuracy of our approach with a diverse selection of photometric measurement data sets in a comprehensive benchmark framework. Furthermore, we provide an extension for specular reflection on surfaces with arbitrary roughness that facilitates the use of existing real-time shading techniques. Our technique is easy to integrate into real-time rendering systems and extends the range of possible applications with photometric area lights.

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