Double-Strength CAFFEINE: Fast Template-Free Symbolic Modeling of Analog Circuits via Implicit Canonical Form Functions and Explicit Introns

AbstractControlled reaction conditions in simple, template-free hydrothermal processes yield Tm-Lu2O3 and Tm-GdVO4 nanocrystals with well-defined specific morphologies and sizes. In both oxide families, nanocrystals prepared at pH 7 reaction media exhibit photoluminescence in ∼1.95 μm similar to bulk single crystals. For the lowest Tm3+ concentration (0.2 % mol) in GdVO4 measured 3H4 and 3F4 fluorescence lifetimes τ are very near to τrad.

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Synthesis of Network Functions for the Discrete-Analog Circuits with Switched Capacitors

Elektrichestvo ◽

10.24160/0013-5380-2017-1-47-53 ◽

2017 ◽

pp. 47-53

Author(s):

Konstantin Sergeyevich GORSHKOV ◽

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Sergei Aleksandrovich KURGANOV ◽

Vladimir Valentinovich FILARETOV ◽

◽

...

Keyword(s):

Analog Circuits ◽

Discrete Analog ◽

Switched Capacitors ◽

Network Functions

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The Relationship Between The Canonical Elements In The Formal Acts Of Defection From The Faith And Schism With Regard To The Canonical Form Of Marriage

10.2986/tren.029-0541 ◽

2003 ◽

Author(s):

James S. KEE

Keyword(s):

Canonical Form ◽

The Relationship

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Analog Circuit Failure Analysis Using Time-Resolved Emission

ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2005p0363 ◽

2005 ◽

Author(s):

B.J. Cain ◽

G.L. Woods ◽

A. Syed ◽

R. Herlein ◽

Toshihiro Nomura

Keyword(s):

Analog Circuits ◽

Integrated Circuit ◽

Analog Circuit ◽

Photon Emission ◽

Nonlinear Process ◽

Time Resolved ◽

Non Invasive ◽

Highly Nonlinear ◽

Excellent Spatial Resolution ◽

5 Ghz

Abstract Time-Resolved Emission (TRE) is a popular technique for non-invasive acquisition of time-domain waveforms from active nodes through the backside of an integrated circuit. [1] State-of-the art TRE systems offer high bandwidths (> 5 GHz), excellent spatial resolution (0.25um), and complete visibility of all nodes on the chip. TRE waveforms are typically used for detecting incorrect signal levels, race conditions, and/or timing faults with resolution of a few ps. However, extracting the exact voltage behavior from a TRE waveform is usually difficult because dynamic photon emission is a highly nonlinear process. This has limited the perceived utility of TRE in diagnosing analog circuits. In this paper, we demonstrate extraction of voltage waveforms in passing and failing conditions from a small-swing, differential logic circuit. The voltage waveforms obtained were crucial in corroborating a theory for some failures inside an 0.18um ASIC.

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