Analysis and testing of analog and mixed-signal circuits by an operation-region model: a case study of application and implementation

2004 ◽  
Author(s):  
Y. Miura ◽  
D. Kato
Keyword(s):  
Mixed Signal ◽  
Mixed Signal Circuits ◽  
Region Model

Combining High-Resolution Pulsed TIVA and Nanoprobing Techniques to Identify Drive Strength Issues in Mixed-Signal Circuits

2010 ◽  
Author(s):  
V.K. Ravikumar ◽  
M.Y. Ho ◽  
R.R. Goruganthu ◽  
S.L. Phoa ◽  
V. Narang ◽  
...  
Keyword(s):  
High Resolution ◽  
Interesting Case ◽  
Circuit Analysis ◽  
Temperature Sensitive ◽  
Solid Immersion Lens ◽  
Induced Voltage ◽  
Process Change ◽  
Mixed Signal ◽  
Mixed Signal Circuits

Abstract This paper uses an interesting case study to highlight high-resolution pulsed thermal-induced voltage alteration (TIVA) with solid immersion lens (SIL) as a technique to isolate a temperature-sensitive failure in mixed-signal circuitry, followed by circuit analysis and nanoprobing to confirm a drive strength issue caused by a process change.

Verification of Analog/Mixed-Signal Circuits Using Symbolic Methods

2008 ◽  
Vol 27 (12) ◽  
pp. 2223-2235 ◽  
Author(s):  
David Walter ◽  
Scott Little ◽  
Chris Myers ◽  
Nicholas Seegmiller ◽  
Tomohiro Yoneda
Keyword(s):  
Mixed Signal ◽  
Mixed Signal Circuits ◽  
Symbolic Methods

Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits

2010 ◽  
Vol 26 (1) ◽  
pp. 73-86 ◽  
Author(s):  
Hongjoong Shin ◽  
Joonsung Park ◽  
Jacob A. Abraham
Keyword(s):  
Mixed Signal ◽  
Mixed Signal Circuits
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