Combining High-Resolution Pulsed TIVA and Nanoprobing Techniques to Identify Drive Strength Issues in Mixed-Signal Circuits
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Abstract This paper uses an interesting case study to highlight high-resolution pulsed thermal-induced voltage alteration (TIVA) with solid immersion lens (SIL) as a technique to isolate a temperature-sensitive failure in mixed-signal circuitry, followed by circuit analysis and nanoprobing to confirm a drive strength issue caused by a process change.
2017 ◽
Vol 45
(11)
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pp. 1701-1741
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2006 ◽
Vol 23
(1)
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pp. 15-34
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