Characterization of the Total Charge and Time Duration for Single-Event Transients Voltage Pulses in a 65 nm CMOS Technology
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2015 ◽
Vol 58
(10)
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pp. 1726-1730
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2016 ◽
Vol 59
(3)
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pp. 488-493
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2012 ◽
Vol 59
(6)
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pp. 2772-2777
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